Mauro V. Tegethoff

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Mission Viejo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Manufacturing functional testing of computing devices using micropr...
- Patent number 5,937,154
- Issue date Aug 10, 1999
- Hewlett-Packard Company
- Mauro V. Tegethoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for manufacturing test simulation in electronic circuit design
- Patent number 5,539,652
- Issue date Jul 23, 1996
- Hewlett-Packard Company
- Mauro V. Tegethoff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intergrated circuit tester
- Patent number D320755
- Issue date Oct 15, 1991
- Hilevel Technology
- Bjorn M. Dahlberg
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
VLSI tester backplane
- Patent number 5,001,422
- Issue date Mar 19, 1991
- Hilevel Technology, Inc.
- Bjorn Dahlberg
- G01 - MEASURING TESTING