Mavin C. Swapp

Person

Mesa, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring time and structure therefor
- Patent number 6,097,674
- Issue date Aug 1, 2000
- Motorola, Inc.
- Mavin C. Swapp
- G04 - HOROLOGY
Information Patent Grant
Wiping contacts
- Patent number 6,037,789
- Issue date Mar 14, 2000
- Motorola, Inc.
- Milo W. Frisbie
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring time and structure therefor
- Patent number 5,796,682
- Issue date Aug 18, 1998
- Motorola, Inc.
- Mavin C. Swapp
- G04 - HOROLOGY
Information Patent Grant
Method for testing integrated devices
- Patent number 5,617,035
- Issue date Apr 1, 1997
- Motorola, Inc.
- Mavin C. Swapp
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever spring and method for temporarily coupling a semiconduct...
- Patent number 5,494,448
- Issue date Feb 27, 1996
- Motorola, Inc.
- Derek Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test with programmable source for both AC and DC...
- Patent number 5,467,024
- Issue date Nov 14, 1995
- Motorola, Inc.
- Mavin C. Swapp
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of correcting loss of test contact continuity
- Patent number 5,459,407
- Issue date Oct 17, 1995
- Motorola, Inc.
- Larry A. Nickerson
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for picking and placing an article
- Patent number 5,385,441
- Issue date Jan 31, 1995
- Motorola, Inc.
- Mavin C. Swapp
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Micromachined semiconductor probe card
- Patent number 5,172,050
- Issue date Dec 15, 1992
- Motorola, Inc.
- Mavin Swapp
- G01 - MEASURING TESTING
Information Patent Grant
Packaged semiconductor device handler
- Patent number 5,151,650
- Issue date Sep 29, 1992
- Motorola, Inc.
- Milo W. Frisbie
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Programmable time delay circuit for digital logic circuits
- Patent number 5,063,311
- Issue date Nov 5, 1991
- Motorola, Inc.
- Mavin C. Swapp
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Antimetastable state circuit
- Patent number 5,020,038
- Issue date May 28, 1991
- Motorola, Inc.
- Mavin Swapp
- G04 - HOROLOGY
Information Patent Grant
Method and apparatus for testing high pin count integrated circuits
- Patent number 4,989,209
- Issue date Jan 29, 1991
- Motorola, Inc.
- Hugh W. Littlebury
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for high speed integrated circuit testing
- Patent number 4,972,413
- Issue date Nov 20, 1990
- Motorola, Inc.
- Hugh W. Littlebury
- G01 - MEASURING TESTING
Information Patent Grant
Digital time base generator with adjustable delay between two outputs
- Patent number 4,943,787
- Issue date Jul 24, 1990
- Motorola, Inc.
- Mavin C. Swapp
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for testing semiconductor devices
- Patent number 4,858,208
- Issue date Aug 15, 1989
- Motorola, Inc.
- Mavin C. Swapp
- G01 - MEASURING TESTING
Information Patent Grant
Mechanical clutch
- Patent number 4,785,925
- Issue date Nov 22, 1988
- Motorola Inc.
- Milo W. Frisbie
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
High speed integrated circuit handler
- Patent number 4,776,747
- Issue date Oct 11, 1988
- Motorola Inc.
- Mavin C. Swapp
- G01 - MEASURING TESTING
Information Patent Grant
Programmable delay circuit
- Patent number 4,745,310
- Issue date May 17, 1988
- Motorola, Inc.
- Mavin C. Swapp
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Buffer apparatus for an integrated circuit handler
- Patent number 4,717,012
- Issue date Jan 5, 1988
- Motorola, Inc.
- Mavin C. Swapp
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Input buffer and article injector mechanism for an automated articl...
- Patent number 4,709,801
- Issue date Dec 1, 1987
- Motorola, Inc.
- Mavin C. Swapp
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for automatic remote activation of an earth-based...
- Patent number 4,704,735
- Issue date Nov 3, 1987
- Telonics, Inc.
- Mavin C. Swapp
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Integrated circuit tester and remote pin electronics therefor
- Patent number 4,694,242
- Issue date Sep 15, 1987
- Motorola Inc.
- John L. Peterson
- G01 - MEASURING TESTING
Information Patent Grant
Article ejector/sorter for an automated article handling system
- Patent number 4,676,359
- Issue date Jun 30, 1987
- Motorola Inc.
- Mavin C. Swapp
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Transport mechanism for an automated integrated circuit handler
- Patent number 4,674,625
- Issue date Jun 23, 1987
- Motorola Inc.
- Mavin C. Swapp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit sleeve handler
- Patent number 4,660,710
- Issue date Apr 28, 1987
- Motorola Inc.
- Mavin C. Swapp
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Cap for integrated circuit sleeve
- Patent number 4,655,364
- Issue date Apr 7, 1987
- Motorola Inc.
- Mavin C. Swapp
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automated circuit tester
- Patent number 4,604,744
- Issue date Aug 5, 1986
- Motorola Inc.
- Hugh Littlebury
- G01 - MEASURING TESTING
Information Patent Grant
Lift and feed mechanism for high speed integrated circuit handler
- Patent number 4,170,290
- Issue date Oct 9, 1979
- Motorola, Inc.
- Milo W. Frisbie
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
High-speed integrated circuit handler
- Patent number 4,128,174
- Issue date Dec 5, 1978
- Motorola, Inc.
- Milo W. Frisbie
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING

Mavin C. Swapp

Person

Patents Grantslast 30 patents

Method for measuring time and structure therefor

Wiping contacts

Method for measuring time and structure therefor

Method for testing integrated devices

Cantilever spring and method for temporarily coupling a semiconduct...

Integrated circuit test with programmable source for both AC and DC...

Apparatus and method of correcting loss of test contact continuity

Method and apparatus for picking and placing an article

Micromachined semiconductor probe card

Packaged semiconductor device handler

Programmable time delay circuit for digital logic circuits

Antimetastable state circuit

Method and apparatus for testing high pin count integrated circuits

Method and apparatus for high speed integrated circuit testing

Digital time base generator with adjustable delay between two outputs

Apparatus and method for testing semiconductor devices

Mechanical clutch

High speed integrated circuit handler

Programmable delay circuit

Buffer apparatus for an integrated circuit handler

Input buffer and article injector mechanism for an automated articl...

System and method for automatic remote activation of an earth-based...

Integrated circuit tester and remote pin electronics therefor

Article ejector/sorter for an automated article handling system

Transport mechanism for an automated integrated circuit handler

Integrated circuit sleeve handler

Cap for integrated circuit sleeve

Automated circuit tester

Lift and feed mechanism for high speed integrated circuit handler

High-speed integrated circuit handler