Max Haider

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Gaiberg, DE

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Patents Grantslast 30 patents

Information Patent Grant
Beam guiding arrangement, imaging method, electron microscopy syste...
- Patent number 7,135,677
- Issue date Nov 14, 2006
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examining system for the particle-optical imaging of an object, def...
- Patent number 6,903,337
- Issue date Jun 7, 2005
- Carl Zeiss SMT AG
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Beam guiding arrangement, imaging method, electron microscopy syste...
- Publication number 20040084621
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS