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Maxim Frayer
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Ridgefield, CT, US
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last 30 patents
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Patent Grant
Raster optic device for optical hyper spectral scanning
Patent number
9,995,627
Issue date
Jun 12, 2018
Smiths Detection Inc.
Maxim Frayer
G01 - MEASURING TESTING
Information
Patent Grant
Dual spectrometer
Patent number
9,869,585
Issue date
Jan 16, 2018
Smiths Detection Inc.
David W. Schiering
G01 - MEASURING TESTING
Information
Patent Grant
Gas identification system
Patent number
7,253,413
Issue date
Aug 7, 2007
Smiths Detection Inc.
Terence Sauer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RASTER OPTIC DEVICE FOR OPTICAL HYPER SPECTRAL SCANNING
Publication number
20160033393
Publication date
Feb 4, 2016
SMITHS DETECTION INC.
Maxim Frayer
G01 - MEASURING TESTING
Information
Patent Application
DUAL SPECTROMETER
Publication number
20150192462
Publication date
Jul 9, 2015
Smiths Detection, Inc.
David W. Schiering
G01 - MEASURING TESTING
Information
Patent Application
Gas identification system
Publication number
20060102844
Publication date
May 18, 2006
SMITHS DETECTION
Terence Sauer
G01 - MEASURING TESTING