Maxim PISARENCO

Person

Son en Breugel, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Aligning a distorted image
- Patent number 12,259,659
- Issue date Mar 25, 2025
- ASML Netherlands B.V.
- Coen Adrianus Verschuren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for decision making in a semiconductor manufacturing process
- Patent number 12,204,252
- Issue date Jan 21, 2025
- ASML Netherlands B.V.
- Arnaud Hubaux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for decision making in a semiconductor manufacturing process
- Patent number 11,687,007
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Arnaud Hubaux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scatterometer and method of scatterometry using acoustic radiation
- Patent number 11,536,654
- Issue date Dec 27, 2022
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for simulating interaction of radiation with...
- Patent number 11,429,763
- Issue date Aug 30, 2022
- ASML Netherlands B.V.
- Remco Dirks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining contribution to a fingerprint
- Patent number 11,378,891
- Issue date Jul 5, 2022
- ASML Netherlands B.V.
- Davit Harutyunyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for calculating electromagnetic scattering pr...
- Patent number 11,347,151
- Issue date May 31, 2022
- ASML Netherlands B.V.
- Markus Gerardus Martinus Maria Van Kraaij
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for image analysis
- Patent number 11,067,901
- Issue date Jul 20, 2021
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for calculating electromagnetic scattering pr...
- Patent number 11,041,816
- Issue date Jun 22, 2021
- ASML Netherlands B.V.
- Maxim Pisarenco
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometer and method of scatterometry using acoustic radiation
- Patent number 10,845,304
- Issue date Nov 24, 2020
- ASML Netherlands B.V.
- Maxim Pisarenco
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining contribution to a fingerprint
- Patent number 10,816,904
- Issue date Oct 27, 2020
- ASML Netherlands B.V.
- Davit Harutyunyan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatuses for measurement of a parameter of a feature...
- Patent number 10,649,345
- Issue date May 12, 2020
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for image analysis
- Patent number 10,607,334
- Issue date Mar 31, 2020
- ASML Netherlands B.V.
- Scott Anderson Middlebrooks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for simulating interaction of radiation with...
- Patent number 10,592,618
- Issue date Mar 17, 2020
- ASML Netherlands B.V.
- Remco Dirks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for parameter determination and apparatus thereof
- Patent number 10,444,638
- Issue date Oct 15, 2019
- ASML Netherlands B.V.
- Nitesh Pandey
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for calculating electromagnetic scattering pro...
- Patent number 10,408,753
- Issue date Sep 10, 2019
- ASML Netherlands B.V.
- Maxim Pisarenco
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for simulating interaction of radiation with...
- Patent number 10,146,140
- Issue date Dec 4, 2018
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for calculating electromagnetic scattering pr...
- Patent number 9,939,250
- Issue date Apr 10, 2018
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reference library generation method for methods of inspection, insp...
- Patent number 8,875,078
- Issue date Oct 28, 2014
- ASML Netherlands B.V.
- Maxim Pisarenco
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
TRAINING A MODEL TO GENERATE PREDICTIVE DATA
- Publication number 20250103964
- Publication date Mar 27, 2025
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...
- Publication number 20240369944
- Publication date Nov 7, 2024
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY TARGET OPTIMIZATION
- Publication number 20240320528
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20240233305
- Publication date Jul 11, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...
- Publication number 20240152060
- Publication date May 9, 2024
- ASML NETHERLANDS B.V.
- Patrick Philipp HELFENSTEIN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DATA-DRIVEN PREDICTION AND IDENTIFICATION OF FAILURE MODES BASED ON...
- Publication number 20240062356
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Huina XU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...
- Publication number 20240054669
- Publication date Feb 15, 2024
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFT...
- Publication number 20240020961
- Publication date Jan 18, 2024
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20230333482
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Arnaud HUBAUX
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...
- Publication number 20230267711
- Publication date Aug 24, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PREDICTING STOCHASTIC CONTRIBUTORS
- Publication number 20230081821
- Publication date Mar 16, 2023
- ASML NETHERLANDS B.V.
- Chrysostomos BATISTAKIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ALIGNING A DISTORTED IMAGE
- Publication number 20230036630
- Publication date Feb 2, 2023
- ASML NETHERLANDS B.V.
- Coen Adrianus VERSCHUREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMOVING AN ARTIFACT FROM AN IMAGE
- Publication number 20230021320
- Publication date Jan 26, 2023
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...
- Publication number 20230004096
- Publication date Jan 5, 2023
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...
- Publication number 20220375063
- Publication date Nov 24, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR APPLYING A DEPOSITION MODEL IN A SEMICONDUCTOR MANUFACTU...
- Publication number 20220350254
- Publication date Nov 3, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
- Publication number 20220342319
- Publication date Oct 27, 2022
- ASML NETHERLANDS B.V.
- Davit Harutyunyan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...
- Publication number 20220342316
- Publication date Oct 27, 2022
- ASML NETHERLANDS B.V.
- Marleen KOOIMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR INCREASING CERTAINTY IN PARAMETERIZED MODEL PREDICTIONS
- Publication number 20220335290
- Publication date Oct 20, 2022
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR PREDICTING SUBSTRATE IMAGE
- Publication number 20220187713
- Publication date Jun 16, 2022
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20220082949
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Arnaud HUBAUX
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DECREASING UNCERTAINTY IN MACHINE LEARNING MODEL PREDICT...
- Publication number 20210286270
- Publication date Sep 16, 2021
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIDDEN DEFECT DETECTION AND EPE ESTIMATION BASED ON THE EXTRACTED 3...
- Publication number 20210174491
- Publication date Jun 10, 2021
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scatterometer and Method of Scatterometry Using Acoustic Radiation
- Publication number 20210055215
- Publication date Feb 25, 2021
- ASML NETHERLANDS B.V.
- Maxim PISARENCO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
- Publication number 20210003927
- Publication date Jan 7, 2021
- ASML NETHERLANDS B.V.
- Davit Harutyunyan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and Apparatus for Simulating Interaction of Radiation with...
- Publication number 20200202054
- Publication date Jun 25, 2020
- ASML NETHERLANDS B.V.
- Remco DIRKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Apparatus for Calculating Electromagnetic Scattering Pr...
- Publication number 20190346775
- Publication date Nov 14, 2019
- ASML NETHERLANDS B.V.
- Markus Gerardus Martinus Maria VAN KRAAIJ
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Publication number 20190310554
- Publication date Oct 10, 2019
- ASML NETHERLANDS B.V.
- Scott Anderson MIDDLEBROOKS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT
- Publication number 20190271919
- Publication date Sep 5, 2019
- ASML NETHERLANDS B.V.
- Davit HARUTYUNYAN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Maxim PISARENCO

Person

Patents Grantslast 30 patents

Aligning a distorted image

Method for decision making in a semiconductor manufacturing process

Method for decision making in a semiconductor manufacturing process

Scatterometer and method of scatterometry using acoustic radiation

Methods and apparatus for simulating interaction of radiation with...

Method for determining contribution to a fingerprint

Methods and apparatus for calculating electromagnetic scattering pr...

Method and apparatus for image analysis

Methods and apparatus for calculating electromagnetic scattering pr...

Scatterometer and method of scatterometry using acoustic radiation

Method for determining contribution to a fingerprint

Methods and apparatuses for measurement of a parameter of a feature...

Method and apparatus for image analysis

Methods and apparatus for simulating interaction of radiation with...

Method for parameter determination and apparatus thereof

Method and apparatus for calculating electromagnetic scattering pro...

Methods and apparatus for simulating interaction of radiation with...

Methods and apparatus for calculating electromagnetic scattering pr...

Reference library generation method for methods of inspection, insp...

Patents Applicationslast 30 patents

TRAINING A MODEL TO GENERATE PREDICTIVE DATA

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPH...

METROLOGY TARGET OPTIMIZATION

ALIGNING A DISTORTED IMAGE

METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...

DATA-DRIVEN PREDICTION AND IDENTIFICATION OF FAILURE MODES BASED ON...

APPARATUS AND METHOD FOR DETERMINING THREE DIMENSIONAL DATA BASED O...

MACHINE LEARNING BASED IMAGE GENERATION OF AFTER-DEVELOPMENT OR AFT...

METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS

APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAININ...

METHOD FOR PREDICTING STOCHASTIC CONTRIBUTORS

ALIGNING A DISTORTED IMAGE

REMOVING AN ARTIFACT FROM AN IMAGE

METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMET...

SYSTEM AND METHOD FOR GENERATING PREDICTIVE IMAGES FOR WAFER INSPEC...

METHOD FOR APPLYING A DEPOSITION MODEL IN A SEMICONDUCTOR MANUFACTU...

METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT

METHOD FOR DETERMINING DEFECTIVENESS OF PATTERN BASED ON AFTER DEVE...

METHOD FOR INCREASING CERTAINTY IN PARAMETERIZED MODEL PREDICTIONS

METHOD AND APPARATUS FOR PREDICTING SUBSTRATE IMAGE

METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS

METHOD FOR DECREASING UNCERTAINTY IN MACHINE LEARNING MODEL PREDICT...

HIDDEN DEFECT DETECTION AND EPE ESTIMATION BASED ON THE EXTRACTED 3...

Scatterometer and Method of Scatterometry Using Acoustic Radiation

METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT

Methods and Apparatus for Simulating Interaction of Radiation with...

Methods and Apparatus for Calculating Electromagnetic Scattering Pr...

METHOD AND APPARATUS FOR IMAGE ANALYSIS

METHOD FOR DETERMINING CONTRIBUTION TO A FINGERPRINT