Maxim Vladimirovich RYABKO

Person

Dolgoprudniy, RU

People

Patents Grantslast 30 patents

Information Patent Grant
System, computing device, and method for extraction of optical prop...
- Patent number 11,353,398
- Issue date Jun 7, 2022
- Samsung Electronics Co., Ltd.
- Alexey Grigorievich Anikanov
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system and method for measuring critical dimens...
- Patent number 9,360,662
- Issue date Jun 7, 2016
- Samsung Electronics Co., Ltd.
- Sergey Nikolaevich Koptyaev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical measuring system and method of measuring critical size
- Patent number 9,322,640
- Issue date Apr 26, 2016
- SAMSING ELECTRONICS CO., LTD.
- Sergey Nikolaevich Koptyaev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
THERMAL SENSOR, THERMAL SENSOR ARRAY, ELECTRONIC APPARATUS INCLUDIN...
- Publication number 20240089568
- Publication date Mar 14, 2024
- Samsung Electronics Co., Ltd.
- Anton Nikolaevich SOFRONOV
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INFRARED DETECTOR AND INFRARED IMAGE SENSOR INCLUDING THE SAME
- Publication number 20230300434
- Publication date Sep 21, 2023
- Samsung Electronics Co., Ltd.
- Maxim Vladimirovich RYABKO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
VISIBLE LIGHT-EMITTING SEMICONDUCTOR LASER DEVICE AND METHOD OF MAN...
- Publication number 20220393434
- Publication date Dec 8, 2022
- Samsung Electronics Co., Ltd.
- Maxim Vladimirovich RYABKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, COMPUTING DEVICE, AND METHOD FOR EXTRACTION OF OPTICAL PROP...
- Publication number 20210262932
- Publication date Aug 26, 2021
- Samsung Electronics Co., Ltd.
- Alexey Grigorievich Anikanov
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM AND METHOD OF MEASURING CRITICAL SIZE
- Publication number 20140043471
- Publication date Feb 13, 2014
- Samsung Electronics Co., Ltd.
- Sergey Nikolaevich KOPTYAEV
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT SYSTEM AND METHOD FOR MEASURING CRITICAL DIMENS...
- Publication number 20130107030
- Publication date May 2, 2013
- Samsung Electronics Co., Ltd.
- Sergey Nikolaevich KOPTYAEV
- B82 - NANO-TECHNOLOGY

Maxim Vladimirovich RYABKO

Person

Patents Grantslast 30 patents

System, computing device, and method for extraction of optical prop...

Optical measurement system and method for measuring critical dimens...

Optical measuring system and method of measuring critical size

Patents Applicationslast 30 patents

THERMAL SENSOR, THERMAL SENSOR ARRAY, ELECTRONIC APPARATUS INCLUDIN...

INFRARED DETECTOR AND INFRARED IMAGE SENSOR INCLUDING THE SAME

VISIBLE LIGHT-EMITTING SEMICONDUCTOR LASER DEVICE AND METHOD OF MAN...

SYSTEM, COMPUTING DEVICE, AND METHOD FOR EXTRACTION OF OPTICAL PROP...

OPTICAL MEASURING SYSTEM AND METHOD OF MEASURING CRITICAL SIZE

OPTICAL MEASUREMENT SYSTEM AND METHOD FOR MEASURING CRITICAL DIMENS...