Maxime Philippe Frederic GENIN

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San Mateo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method to predict yield of a device manufacturing process
- Patent number 12,055,904
- Issue date Aug 6, 2024
- ASML Netherlands B.V.
- Youping Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing devices
- Patent number 12,044,980
- Issue date Jul 23, 2024
- ASML Netherlands B.V.
- Abraham Slachter
- G05 - CONTROLLING REGULATING
Information Patent Grant
Determining pattern ranking based on measurement feedback from prin...
- Patent number 12,038,694
- Issue date Jul 16, 2024
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for determining root cause affecting yield in a semiconducto...
- Patent number 11,803,127
- Issue date Oct 31, 2023
- ASML Netherlands B.V.
- Chenxi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining pattern ranking based on measurement feedback from prin...
- Patent number 11,635,699
- Issue date Apr 25, 2023
- ASML Netherlands B.V.
- Youping Zhang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect prediction
- Patent number 11,403,453
- Issue date Aug 2, 2022
- ASML Netherlands B.V.
- Lin Lee Cheong
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING PATTERN RANKING BASED ON MEASUREMENT FEEDBACK FROM PRIN...
- Publication number 20230236512
- Publication date Jul 27, 2023
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINING PATTERN RANKING BASED ON MEASUREMENT FEEDBACK FROM PRIN...
- Publication number 20220043356
- Publication date Feb 10, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD TO PREDICT YIELD OF A DEVICE MANUFACTURING PROCESS
- Publication number 20220011728
- Publication date Jan 13, 2022
- ASML NETHERLANDS B.V.
- Youping ZHANG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF MANUFACTURING DEVICES
- Publication number 20210397172
- Publication date Dec 23, 2021
- ASML NETHERLANDS B.V.
- Abraham SLACHTER
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR DETERMINING ROOT CAUSE AFFECTING YIELD IN A SEMICONDUCTO...
- Publication number 20210389677
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Chenxi LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT PREDICTION
- Publication number 20210150115
- Publication date May 20, 2021
- ASML NETHERLANDS B.V.
- Lin Lee CHEONG
- G06 - COMPUTING CALCULATING COUNTING