Maximilian Haider

Person

Gaiberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 10,504,681
- Issue date Dec 10, 2019
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,673,024
- Issue date Jun 6, 2017
- Applied Materials Israel, Ltd.
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,224,576
- Issue date Dec 29, 2015
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 8,097,847
- Issue date Jan 17, 2012
- Carl Ziess SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 7,554,094
- Issue date Jun 30, 2009
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron/ion gun for electron or ion beams with high monochromasy o...
- Patent number 6,770,878
- Issue date Aug 3, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for eliminating first, second and third-order axial image de...
- Patent number 6,646,267
- Issue date Nov 11, 2003
- Maximilian Haider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for correcting third-order spherical aberration in a lens, e...
- Patent number 6,605,810
- Issue date Aug 12, 2003
- Maximilian Haider
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...
- Publication number 20170287674
- Publication date Oct 5, 2017
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...
- Publication number 20160111251
- Publication date Apr 21, 2016
- Carl Zeiss Microscopy GmbH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20140158902
- Publication date Jun 12, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20120104252
- Publication date May 3, 2012
- Applied Materials Israel Ltd.
- Rainer KNIPPELMEYER
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20100181479
- Publication date Jul 22, 2010
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20080054184
- Publication date Mar 6, 2008
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Electron/ion gun for electron or ion beams with high monochromasy o...
- Publication number 20030098414
- Publication date May 29, 2003
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS

Maximilian Haider

Person

Patents Grantslast 30 patents

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Electron/ion gun for electron or ion beams with high monochromasy o...

Method for eliminating first, second and third-order axial image de...

Device for correcting third-order spherical aberration in a lens, e...

Patents Applicationslast 30 patents

PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...

PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Electron/ion gun for electron or ion beams with high monochromasy o...