Maximus Theodorus Otten

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Patents Grantslast 30 patents

Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,581,526
- Issue date Feb 28, 2017
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of calibrating a scanning transmission charged-particle micr...
- Patent number 9,396,907
- Issue date Jul 19, 2016
- FEI Company
- Maximus Theodorus Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,275,831
- Issue date Mar 1, 2016
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 8,890,064
- Issue date Nov 18, 2014
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Method of protecting a radiation detector in a charged particle ins...
- Patent number 8,492,715
- Issue date Jul 23, 2013
- FEI Company
- Maximus Theodorus Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 8,455,821
- Issue date Jun 4, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20160163506
- Publication date Jun 9, 2016
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF CALIBRATING A SCANNING TRANSMISSION CHARGED-PARTICLE MICR...
- Publication number 20160013016
- Publication date Jan 14, 2016
- FEI Company
- Maximus Theodorus Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for S/TEM Sample Analysis
- Publication number 20150206707
- Publication date Jul 23, 2015
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20130341505
- Publication date Dec 26, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Application
Method of protecting a radiation detector in a charged particle ins...
- Publication number 20120256085
- Publication date Oct 11, 2012
- FEI Company
- Maximus Theodorus Otten
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20110006207
- Publication date Jan 13, 2011
- FEI COMPANY
- Jason Arjavac
- G01 - MEASURING TESTING