MAYANK PARASRAMPURIA

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Jaipur, IN

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Patents Grantslast 30 patents

Information Patent Grant
Scan wrapper circuit for integrated circuit
- Patent number 9,568,551
- Issue date Feb 14, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Sagar Kataria
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LBIST DEBUG CONTROLLER
- Publication number 20170097388
- Publication date Apr 6, 2017
- FREESCALE SEMICONDUCTOR, INC.
- MAYANK PARASRAMPURIA
- G01 - MEASURING TESTING