Mayank Tutwani

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New Delhi, IN

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with scan chain having dual-edge triggered scann...
- Patent number 9,599,672
- Issue date Mar 21, 2017
- NXP USA, INC.
- Kumar Abhishek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH SCAN CHAIN HAVING DUAL-EDGE TRIGGERED SCANN...
- Publication number 20160169966
- Publication date Jun 16, 2016
- FREESCALE SIMICONDUCTOR, INC.
- KUMAR ABSHISHEK
- G01 - MEASURING TESTING