Mayeul DURAND DE GEVIGNEY

Person

Chambery, FR

People

Patents Grantslast 30 patents

Information Patent Grant
System for optical inspection of a substrate using same or differen...
- Patent number 12,163,899
- Issue date Dec 10, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Substrate dimension adapter
- Patent number 12,074,400
- Issue date Aug 27, 2024
- UNITY SEMICONDUCTOR
- Yueh Sheng Ow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dark-field optical inspection device
- Patent number 11,965,834
- Issue date Apr 23, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optically inspecting a substrate
- Patent number 11,300,520
- Issue date Apr 12, 2022
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting boards for microelectronics or opt...
- Patent number 11,092,644
- Issue date Aug 17, 2021
- UNITY SEMICONDUCTOR
- Philippe Gastaldo
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric method and system using variable fringe spacing for...
- Patent number 10,260,868
- Issue date Apr 16, 2019
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting wafers for electronics, optics or...
- Patent number 9,857,313
- Issue date Jan 2, 2018
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFEREN...
- Publication number 20240068956
- Publication date Feb 29, 2024
- Unity Semiconductor
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Application
DARK-FIELD OPTICAL INSPECTING DEVICE
- Publication number 20210349037
- Publication date Nov 11, 2021
- Unity Semiconductor
- Mayeul DURAND DE GEVIGNEY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING A SUBSTRATE
- Publication number 20210215617
- Publication date Jul 15, 2021
- Unity Semiconductor
- Mayeul DURAND DE GEVIGNEY
- G01 - MEASURING TESTING
Information Patent Application
LIGHTING DEVICE FOR MICROSCOPE
- Publication number 20210116694
- Publication date Apr 22, 2021
- Unity Semiconductor
- Mayeul DURAND DE GEVIGNEY
- G02 - OPTICS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING BOARDS FOR MICROELECTRONICS OR OPT...
- Publication number 20200271718
- Publication date Aug 27, 2020
- Unity Semiconductor
- Philippe GASTALDO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING TRANSPARENT WAFERS FOR ELECTRONICS...
- Publication number 20180231370
- Publication date Aug 16, 2018
- Unity Semiconductor
- Mayeul DURAND DE GEVIGNEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING WAFERS FOR ELECTRONICS, OPTICS OR...
- Publication number 20170219496
- Publication date Aug 3, 2017
- UNITY SEMICONDUCTOR
- Mayeul DURAND DE GEVIGNEY
- G01 - MEASURING TESTING

Mayeul DURAND DE GEVIGNEY

Person

Patents Grantslast 30 patents

System for optical inspection of a substrate using same or differen...

Substrate dimension adapter

Dark-field optical inspection device

Method and system for optically inspecting a substrate

Method and system for inspecting boards for microelectronics or opt...

Interferometric method and system using variable fringe spacing for...

Method and system for inspecting wafers for electronics, optics or...

Patents Applicationslast 30 patents

SYSTEM FOR OPTICAL INSPECTION OF A SUBSTRATE USING SAME OR DIFFEREN...

DARK-FIELD OPTICAL INSPECTING DEVICE

METHOD AND SYSTEM FOR OPTICALLY INSPECTING A SUBSTRATE

LIGHTING DEVICE FOR MICROSCOPE

METHOD AND SYSTEM FOR INSPECTING BOARDS FOR MICROELECTRONICS OR OPT...

METHOD AND SYSTEM FOR INSPECTING TRANSPARENT WAFERS FOR ELECTRONICS...

METHOD AND SYSTEM FOR INSPECTING WAFERS FOR ELECTRONICS, OPTICS OR...