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Mayue Xie
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Phoenix, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated circuit package with test circuitry for testing a channe...
Patent number
11,450,613
Issue date
Sep 20, 2022
Intel Corporation
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Integrated cable probe design for high bandwidth RF testing
Patent number
11,226,353
Issue date
Jan 18, 2022
Intel Corporation
Chengqing Hu
G01 - MEASURING TESTING
Information
Patent Grant
Method of resonance analysis for electrical fault isolation
Patent number
10,935,593
Issue date
Mar 2, 2021
Intel Corporation
Deepak Goyal
G01 - MEASURING TESTING
Information
Patent Grant
Characterization of transmission media
Patent number
10,908,206
Issue date
Feb 2, 2021
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Grant
High power terahertz impulse for fault isolation
Patent number
10,746,780
Issue date
Aug 18, 2020
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for classifying and locating electrical faults...
Patent number
10,088,518
Issue date
Oct 2, 2018
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method to monitor die edge defects
Patent number
10,026,664
Issue date
Jul 17, 2018
Intel Corporation
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Terahertz transmission contactless probing and scanning for signal...
Patent number
9,817,028
Issue date
Nov 14, 2017
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method to monitor die edge defects
Patent number
9,564,381
Issue date
Feb 7, 2017
Intel Corporation
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method to monitor die edge defects
Patent number
9,159,646
Issue date
Oct 13, 2015
Intel Corporation
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Connector compression tool
Patent number
8,356,402
Issue date
Jan 22, 2013
John Mezzalingua Associates, Inc.
Mayue Xie
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Connector compression tool
Patent number
8,112,877
Issue date
Feb 14, 2012
John Mezzalingua Associates, Inc.
Mayue Xie
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Method of compressing a connector
Patent number
8,112,876
Issue date
Feb 14, 2012
John Mezzalingua Associates, Inc.
Mayue Xie
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Connector compression tool
Patent number
7,823,271
Issue date
Nov 2, 2010
John Mezzalingua Associates, Inc.
Mayue Xie
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Tool adaptor
Patent number
7,607,218
Issue date
Oct 27, 2009
John Mezzalingua Associates, Inc.
Noah Montena
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CABLE PROBE DESIGN FOR HIGH BANDWIDTH RF TESTING
Publication number
20210132113
Publication date
May 6, 2021
Intel Corporation
Chengqing Hu
G01 - MEASURING TESTING
Information
Patent Application
CHARACTERIZATION OF TRANSMISSION MEDIA
Publication number
20190293708
Publication date
Sep 26, 2019
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT PACKAGE WITH TEST CIRCUITRY FOR TESTING A CHANNE...
Publication number
20190295953
Publication date
Sep 26, 2019
Intel Corporation
Mayue XIE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF RESONANCE ANALYSIS FOR ELECTRICAL FAULT ISOLATION
Publication number
20190204376
Publication date
Jul 4, 2019
Deepak Goyal
G01 - MEASURING TESTING
Information
Patent Application
HIGH POWER TERAHERTZ IMPULSE FOR FAULT ISOLATION
Publication number
20180335465
Publication date
Nov 22, 2018
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR CLASSIFYING AND LOCATING ELECTRICAL FAULTS...
Publication number
20180284185
Publication date
Oct 4, 2018
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD TO MONITOR DIE EDGE DEFECTS
Publication number
20170141006
Publication date
May 18, 2017
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ TRANSMISSION CONTACTLESS PROBING AND SCANNING FOR SIGNAL...
Publication number
20170089951
Publication date
Mar 30, 2017
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT DEVICE INSPECTION SYSTEMS USING TEMPERATURE GRADIENTS
Publication number
20160274044
Publication date
Sep 22, 2016
Intel Corporation
Mayue Xie
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD TO MONITOR DIE EDGE DEFECTS
Publication number
20160043011
Publication date
Feb 11, 2016
Intel Corporation
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD TO MONITOR DIE EDGE DEFECTS
Publication number
20140168879
Publication date
Jun 19, 2014
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONNECTOR COMPRESSION TOOL
Publication number
20120102728
Publication date
May 3, 2012
JOHN MEZZALINGUA ASSOCIATES, INC. D/B/A PPC
Mayue Xie
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
CONNECTOR COMPRESSION TOOL AND METHOD OF USE THEREOF
Publication number
20110041326
Publication date
Feb 24, 2011
John Mezzalingua Associates, Inc.
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CONNECTOR COMPRESSION TOOL
Publication number
20110041327
Publication date
Feb 24, 2011
John Mezzalingua Associates, Inc.
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Tool adaptor
Publication number
20060179647
Publication date
Aug 17, 2006
John Mezzalingua Associates, Inc.
Noah Montena
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Connector compression tool and method of use thereof
Publication number
20060179646
Publication date
Aug 17, 2006
Mayue Xie
H01 - BASIC ELECTRIC ELEMENTS