Mayuka IWASAKI

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope system and method for evaluating film thickness...
- Patent number 8,502,145
- Issue date Aug 6, 2013
- Hitachi High-Technologies Corporation
- Mayuka Iwasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle beam device
- Patent number 8,357,897
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope system and method for evaluating film thickness...
- Patent number 8,217,348
- Issue date Jul 10, 2012
- Hitachi High-Technologies Corporation
- Mayuka Iwasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measuring dimension using electron microscope
- Patent number 7,817,860
- Issue date Oct 19, 2010
- Hitachi High-Technologies Corporation
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring dimension using electron microscope
- Patent number 7,460,714
- Issue date Dec 2, 2008
- Hitachi High-Technologies Corporation
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring dimension using electron microscope
- Patent number 7,269,287
- Issue date Sep 11, 2007
- Hitachi High-Technologies Corporation
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON MICROSCOPE SYSTEM AND METHOD FOR EVALUATING FILM THICKNESS...
- Publication number 20120267529
- Publication date Oct 25, 2012
- Mayuka Iwasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20120104254
- Publication date May 3, 2012
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DIMENSION USING ELECTRON MICROSCOPE
- Publication number 20090224152
- Publication date Sep 10, 2009
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electron Microscope System and Method for Evaluating Film Thickness...
- Publication number 20090212211
- Publication date Aug 27, 2009
- Hitachi High-Technologies Corporation
- Mayuka IWASAKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and apparatus for measuring dimension using electron microscope
- Publication number 20070286494
- Publication date Dec 13, 2007
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DIMENSION USING ELECTRON MICROSCOPE
- Publication number 20070092130
- Publication date Apr 26, 2007
- Chie Shishido
- G06 - COMPUTING CALCULATING COUNTING