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Mayuka Osaki
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning electron microscopy system and pattern depth measurement m...
Patent number
11,545,336
Issue date
Jan 3, 2023
HITACHI HIGH-TECH CORPORATION
Takahiro Nishihata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic microscope device
Patent number
11,355,304
Issue date
Jun 7, 2022
HITACHI HIGH-TECH CORPORATION
Takahiro Nishihata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope apparatus, inspection system using electron mic...
Patent number
11,302,513
Issue date
Apr 12, 2022
HITACHI HIGH-TECH CORPORATION
Takahiro Nishihata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern cross-sectional shape estimation system and program
Patent number
11,211,226
Issue date
Dec 28, 2021
HITACHI HIGH-TECH CORPORATION
Toshiyuki Yokosuka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning electron microscope and calculation method for three-dimen...
Patent number
11,164,720
Issue date
Nov 2, 2021
HITACHI HIGH-TECH CORPORATION
Kenji Yasui
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electron microscope
Patent number
10,186,399
Issue date
Jan 22, 2019
Hitachi High-Technologies Corporation
Mayuka Osaki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pattern evaluation method and pattern evaluation device
Patent number
9,488,815
Issue date
Nov 8, 2016
Hitachi High-Technologies Corporation
Atsushi Miyamoto
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Estimating shape based on comparison between actual waveform and li...
Patent number
8,671,366
Issue date
Mar 11, 2014
Hitachi High-Technologies Corporation
Maki Tanaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OBSERVATION SYSTEM, OBSERVATION METHOD, AND PROGRAM
Publication number
20230238210
Publication date
Jul 27, 2023
HITACHI HIGH-TECH CORPORATION
Hiroaki KASAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM
Publication number
20230230886
Publication date
Jul 20, 2023
HITACHI HIGH-TECH CORPORATION
Kenji YASUI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20220367147
Publication date
Nov 17, 2022
Hitachi High-Tech Corporation
Takahiro NISHIHATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRONIC MICROSCOPE DEVICE
Publication number
20210225608
Publication date
Jul 22, 2021
HITACHI HIGH-TECH CORPORATION
Takahiro NISHIHATA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPY SYSTEM AND PATTERN DEPTH MEASUREMENT M...
Publication number
20210027983
Publication date
Jan 28, 2021
Hitachi High-Tech Corporation
Takahiro Nishihata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON MICROSCOPE APPARATUS, INSPECTION SYSTEM USING ELECTRON MIC...
Publication number
20210012998
Publication date
Jan 14, 2021
Hitachi High-Tech Corporation
Takahiro Nishihata
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM
Publication number
20200321189
Publication date
Oct 8, 2020
HITACHI HIGH-TECH CORPORATION
Toshiyuki YOKOSUKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...
Publication number
20200234916
Publication date
Jul 23, 2020
Hitachi High-Technologies Corporation
Kenji YASUI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCANNING ELECTRON MICROSCOPE
Publication number
20170301513
Publication date
Oct 19, 2017
Hitachi High-Technologies Corporation
Mayuka OSAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Microscope System and Measurement Method Using Same
Publication number
20150235804
Publication date
Aug 20, 2015
Hitachi High-Technologies Corporation
Mayuka Osaki
G02 - OPTICS
Information
Patent Application
PATTERN EVALUATION METHOD AND PATTERN EVALUATION DEVICE
Publication number
20140320627
Publication date
Oct 30, 2014
Atsushi Miyamoto
G02 - OPTICS
Information
Patent Application
Pattern Shape Estimation Method and Pattern Measuring Device
Publication number
20120151428
Publication date
Jun 14, 2012
Hitachi High-Technologies Corporation
Maki Tanaka
G01 - MEASURING TESTING
Information
Patent Application
PATTERN SHAPE SELECTION METHOD AND PATTERN MEASURING DEVICE
Publication number
20120126116
Publication date
May 24, 2012
Hitachi High-Technologies Corporation
Maki Tanaka
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EVALUATING SUPERIMPOSITION OF PATTERN
Publication number
20110268363
Publication date
Nov 3, 2011
Mayuka Osaki
G06 - COMPUTING CALCULATING COUNTING