Mayuko TANAKA

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection management system, inspection management apparatuses, an...
- Patent number 11,154,001
- Issue date Oct 19, 2021
- Omron Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Inspection management system, inspection management apparatuses, an...
- Patent number 10,876,977
- Issue date Dec 29, 2020
- Omron Corporation
- Hiroyuki Mori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECT...
- Publication number 20240319703
- Publication date Sep 26, 2024
- Omron Corporation
- Hiroyuki MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
QUALITY IMPROVEMENT ASSISTING DEVICE AND QUALITY IMPROVEMENT ASSIST...
- Publication number 20240085896
- Publication date Mar 14, 2024
- Omron Corporation
- Hiroyuki MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
QUALITY IMPROVEMENT ASSISTANCE DEVICE
- Publication number 20240061408
- Publication date Feb 22, 2024
- Omron Corporation
- Hiroyuki MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM
- Publication number 20240061402
- Publication date Feb 22, 2024
- Omron Corporation
- Hiroyuki MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
MANAGEMENT DEVICE AND MANAGEMENT SYSTEM
- Publication number 20240061405
- Publication date Feb 22, 2024
- Omron Corporation
- Hiroyuki MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM
- Publication number 20240027364
- Publication date Jan 25, 2024
- Omron Corporation
- Hiroyuki MORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
- Publication number 20190219521
- Publication date Jul 18, 2019
- Omron Corporation
- Hiroyuki MORI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
- Publication number 20190223337
- Publication date Jul 18, 2019
- Omron Corporation
- Hiroyuki MORI
- G01 - MEASURING TESTING

Mayuko TANAKA

Person

Patents Grantslast 30 patents

Inspection management system, inspection management apparatuses, an...

Inspection management system, inspection management apparatuses, an...

Patents Applicationslast 30 patents

INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT DEVICE, INSPECT...

QUALITY IMPROVEMENT ASSISTING DEVICE AND QUALITY IMPROVEMENT ASSIST...

QUALITY IMPROVEMENT ASSISTANCE DEVICE

MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM

MANAGEMENT DEVICE AND MANAGEMENT SYSTEM

MANAGEMENT SYSTEM, MANAGEMENT DEVICE, MANAGEMENT METHOD, AND PROGRAM

INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...

INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...