Mayumi ODAIRA

Person

Akiruno-shi, Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Data acquisition apparatus
- Patent number 11,965,830
- Issue date Apr 23, 2024
- EVIDENT CORPORATION
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup apparatus with rotation unit
- Patent number 11,808,931
- Issue date Nov 7, 2023
- EVIDENT CORPORATION
- Satoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation device with focusing function
- Patent number 11,150,459
- Issue date Oct 19, 2021
- Olympus Corporation
- Mayumi Odaira
- G02 - OPTICS
Information Patent Grant
Sample observation apparatus
- Patent number 10,983,055
- Issue date Apr 20, 2021
- Olympus Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Sample shape measuring apparatus for calculating a shape of a sampl...
- Patent number 10,697,764
- Issue date Jun 30, 2020
- Olympus Corporation
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Sample shape measuring apparatus
- Patent number 10,539,411
- Issue date Jan 21, 2020
- Olympus Corporation
- Mayumi Odaira
- G01 - MEASURING TESTING
Information Patent Grant
Sample shape measuring method and sample shape measuring apparatus
- Patent number 10,458,781
- Issue date Oct 29, 2019
- Olympus Corporation
- Mayumi Odaira
- G02 - OPTICS
Information Patent Grant
Sample shape measuring method and sample shape measuring apparatus
- Patent number 10,458,785
- Issue date Oct 29, 2019
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE STRUCTURE MEASURING DEVICE AND SAMPLE STRUCTURE MEASURING ME...
- Publication number 20220196543
- Publication date Jun 23, 2022
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PICKUP APPARATUS
- Publication number 20210191096
- Publication date Jun 24, 2021
- OLYMPUS CORPORATION
- Satoshi WATANABE
- G02 - OPTICS
Information Patent Application
DATA ACQUISITION APPARATUS
- Publication number 20210048387
- Publication date Feb 18, 2021
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE OBSERVATION DEVICE WITH FOCUSING FUNCTION
- Publication number 20200041777
- Publication date Feb 6, 2020
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION APPARATUS
- Publication number 20190271644
- Publication date Sep 5, 2019
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190265022
- Publication date Aug 29, 2019
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G02 - OPTICS
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20190265024
- Publication date Aug 29, 2019
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20180313643
- Publication date Nov 1, 2018
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20180073865
- Publication date Mar 15, 2018
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS

Mayumi ODAIRA

Person

Patents Grantslast 30 patents

Data acquisition apparatus

Image pickup apparatus with rotation unit

Sample observation device with focusing function

Sample observation apparatus

Sample shape measuring apparatus for calculating a shape of a sampl...

Sample shape measuring apparatus

Sample shape measuring method and sample shape measuring apparatus

Sample shape measuring method and sample shape measuring apparatus

Patents Applicationslast 30 patents

SAMPLE STRUCTURE MEASURING DEVICE AND SAMPLE STRUCTURE MEASURING ME...

IMAGE PICKUP APPARATUS

DATA ACQUISITION APPARATUS

SAMPLE OBSERVATION DEVICE WITH FOCUSING FUNCTION

SAMPLE OBSERVATION APPARATUS

SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS