Md M. Hoque

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuits devices with counter-doped conductive gates
- Patent number 9,991,356
- Issue date Jun 5, 2018
- NXP USA, INC.
- Weize Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sensitive field effect transistors with protection diodes and m...
- Patent number 9,978,689
- Issue date May 22, 2018
- NXP USA, INC.
- Md M. Hoque
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for an ISFET
- Patent number 9,964,516
- Issue date May 8, 2018
- NXP USA, INC.
- Patrice M. Parris
- G05 - CONTROLLING REGULATING
Information Patent Grant
Protected sensor field effect transistors
- Patent number 9,857,329
- Issue date Jan 2, 2018
- NXP USA, INC.
- Patrice M. Parris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for an ISFET
- Patent number 9,599,587
- Issue date Mar 21, 2017
- NXP USA, INC.
- Patrice M. Parris
- G05 - CONTROLLING REGULATING
Information Patent Grant
Enhanced sensitivity ion sensing devices
- Patent number 9,541,521
- Issue date Jan 10, 2017
- NXP USA, INC.
- Md M. Hoque
- G01 - MEASURING TESTING
Information Patent Grant
Protected sensor field effect transistors
- Patent number 9,494,550
- Issue date Nov 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Patrice M. Parris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit devices with counter-doped conductive gates
- Patent number 9,437,701
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Weize Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Differential pair sensing circuit structures
- Patent number 9,423,376
- Issue date Aug 23, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Md M. Hoque
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for an ISFET
- Patent number 8,878,257
- Issue date Nov 4, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Patrice M. Parris
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and integrated circuit package for sensing fluid properties
- Patent number 8,776,274
- Issue date Jul 15, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Partice M. Parris
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR CONTROLLING MEMORY ARRAY POWER CONSUMPTION
- Publication number 20180260014
- Publication date Sep 13, 2018
- NXP USA, Inc.
- Patrice M. PARRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND SENSOR DEVICES FOR SENSING FLUID PROPERTIES
- Publication number 20180059052
- Publication date Mar 1, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Md M. HOQUE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ISFET
- Publication number 20170146485
- Publication date May 25, 2017
- NXP USA, Inc.
- Patrice M. Parris
- G01 - MEASURING TESTING
Information Patent Application
PROTECTED SENSOR FIELD EFFECT TRANSISTORS
- Publication number 20160370314
- Publication date Dec 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Patrice M. Parris
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICES WITH COUNTER-DOPED CONDUCTIVE GATES
- Publication number 20160365422
- Publication date Dec 15, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Weize Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROTECTED SENSOR FIELD EFFECT TRANSISTORS
- Publication number 20160356740
- Publication date Dec 8, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Patrice M. Parris
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT DEVICES WITH COUNTER-DOPED CONDUCTIVE GATES
- Publication number 20160118469
- Publication date Apr 28, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Weize Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Differential Pair Sensing Circuit Structures
- Publication number 20150316503
- Publication date Nov 5, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Md M. Hoque
- G01 - MEASURING TESTING
Information Patent Application
ION SENSITIVE FIELD EFFECT TRANSISTORS WITH PROTECTION DIODES AND M...
- Publication number 20150171018
- Publication date Jun 18, 2015
- MD M. HOQUE
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ISFET
- Publication number 20140375370
- Publication date Dec 25, 2014
- PATRICE M. PARRIS
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND INTEGRATED CIRCUIT PACKAGE FOR SENSING FLUID PROPERTIES
- Publication number 20140117468
- Publication date May 1, 2014
- FREESCALE SEMICONDUCTOR, INC.
- PATRICE M. PARRIS
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR AN ISFET
- Publication number 20110299337
- Publication date Dec 8, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Patrice M. Parris
- G05 - CONTROLLING REGULATING

Md M. Hoque

Person

Patents Grantslast 30 patents

Integrated circuits devices with counter-doped conductive gates

Ion sensitive field effect transistors with protection diodes and m...

Methods and apparatus for an ISFET

Protected sensor field effect transistors

Methods and apparatus for an ISFET

Enhanced sensitivity ion sensing devices

Protected sensor field effect transistors

Integrated circuit devices with counter-doped conductive gates

Differential pair sensing circuit structures

Methods and apparatus for an ISFET

Methods and integrated circuit package for sensing fluid properties

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR CONTROLLING MEMORY ARRAY POWER CONSUMPTION

METHODS AND SENSOR DEVICES FOR SENSING FLUID PROPERTIES

METHODS AND APPARATUS FOR AN ISFET

PROTECTED SENSOR FIELD EFFECT TRANSISTORS

INTEGRATED CIRCUIT DEVICES WITH COUNTER-DOPED CONDUCTIVE GATES

PROTECTED SENSOR FIELD EFFECT TRANSISTORS

INTEGRATED CIRCUIT DEVICES WITH COUNTER-DOPED CONDUCTIVE GATES

Differential Pair Sensing Circuit Structures

ION SENSITIVE FIELD EFFECT TRANSISTORS WITH PROTECTION DIODES AND M...

METHODS AND APPARATUS FOR AN ISFET

METHODS AND INTEGRATED CIRCUIT PACKAGE FOR SENSING FLUID PROPERTIES

METHODS AND APPARATUS FOR AN ISFET