Mee-Choo ONG

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Batu Maung, MY

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Patents Grantslast 30 patents

Information Patent Grant
Memory access bases on erase cycle time
- Patent number 9,588,695
- Issue date Mar 7, 2017
- Cypress Semiconductor Corporation
- Mee-Choo Ong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Auto resume of irregular erase stoppage of a memory sector
- Patent number 9,373,405
- Issue date Jun 21, 2016
- CYPRESS SEMICONDUCTORS CORPORATION
- Wei-Kent Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
For test (DFT) read speed through transition detector in built-in s...
- Patent number 8,964,484
- Issue date Feb 24, 2015
- Spansion LLC
- Mee-Choo Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Charge retention for flash memory by manipulating the program data...
- Patent number 8,379,443
- Issue date Feb 19, 2013
- Spansion LLC
- Sheau-Yang Ch'ng
- G11 - INFORMATION STORAGE
Information Patent Grant
Absolute encoder
- Patent number 7,112,781
- Issue date Sep 26, 2006
- Avago Technologies ECBU IP (Singapore) Pte Ltd
- Sheau Yang Ch'ng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Memory Access Bases on Erase Cycle Time
- Publication number 20150253988
- Publication date Sep 10, 2015
- SPANSION LLC
- Mee-Choo ONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Auto Resume of Irregular Erase Stoppage of a Memory Sector
- Publication number 20150149696
- Publication date May 28, 2015
- SPANSION LLC
- Wei-Kent ONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN FOR TEST (DFT) READ SPEED THROUGH TRANSITION DETECTOR IN BUI...
- Publication number 20140185393
- Publication date Jul 3, 2014
- SPANSION, LLC
- Mee-Choo ONG
- G11 - INFORMATION STORAGE
Information Patent Application
CHARGE RETENTION FOR FLASH MEMORY BY MANIPULATING THE PROGRAM DATA...
- Publication number 20100302846
- Publication date Dec 2, 2010
- Sheau-Yang Ch'ng
- G11 - INFORMATION STORAGE
Information Patent Application
Absolute encoder
- Publication number 20050236560
- Publication date Oct 27, 2005
- Sheau Yang Ch'ng
- G01 - MEASURING TESTING