Mee Kyung Lim

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of testing an interconnection substrate and apparatus for pe...
- Patent number 11,047,901
- Issue date Jun 29, 2021
- Samsung Electronics Co., Ltd.
- Mee-Hyun Lim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of testing a wiring circuit
- Patent number 11,016,143
- Issue date May 25, 2021
- Samsung Electronics Co., Ltd.
- Mee-hyun Lim
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing an interconnect circuit and method...
- Patent number 10,942,216
- Issue date Mar 9, 2021
- Samsung Electronics Co., Ltd.
- Sung-Yeol Kim
- G01 - MEASURING TESTING
Information Patent Grant
Marker used for measuring displacement of moving object and method...
- Patent number 6,731,392
- Issue date May 4, 2004
- Samsung Corporation
- Seok Ho Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD
- Publication number 20230116739
- Publication date Apr 13, 2023
- Samsung Electronics Co., Ltd.
- Sung Hwi CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING AN INTERCONNECTION SUBSTRATE AND APPARATUS FOR PE...
- Publication number 20200166563
- Publication date May 28, 2020
- Samsung Electronics Co., Ltd.
- Mee-Hyun LIM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF TESTING A WIRING CIRCUIT
- Publication number 20200132758
- Publication date Apr 30, 2020
- Samsung Electronics Co., Ltd.
- MEE-HYUN LIM
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING AN INTERCONNECT CIRCUIT AND METHOD...
- Publication number 20190113565
- Publication date Apr 18, 2019
- Samsung Electronics Co., Ltd.
- Sung-Yeol Kim
- G01 - MEASURING TESTING
Information Patent Application
ARCHITECTURE OF A NETWORK DEVICE FOR PROCESSING APPLICATIONS, AND C...
- Publication number 20110302274
- Publication date Dec 8, 2011
- Joon Hui Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Marker used for measuring displacement of moving object and method...
- Publication number 20030030820
- Publication date Feb 13, 2003
- SAMSUNG CORPORATION
- Seok Ho Kim
- G01 - MEASURING TESTING