Meehyun Lim

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate processing apparatus
- Patent number 12,235,287
- Issue date Feb 25, 2025
- Samsung Electronics Co., Ltd.
- Daesung Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric field measuring apparatus and method of measuring electric...
- Patent number 12,105,132
- Issue date Oct 1, 2024
- Samsung Electronics Co., Ltd.
- Jinyeong Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test device and system and test method using the same
- Patent number 11,782,085
- Issue date Oct 10, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRIC FIELD MEASURING APPARATUS AND METHOD OF MEASURING ELECTRIC...
- Publication number 20250004028
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Jinyeong Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIELECTRIC STRUCTURE AND SUBSTRATE PROCESSING APPARATUS INCLUDING T...
- Publication number 20240274661
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Sungyoung YOON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR EQUIPMENT MONITORING APPARATUS, AND SEMICONDUCTOR EQU...
- Publication number 20240055243
- Publication date Feb 15, 2024
- Samsung Electronics Co., Ltd.
- Taekjin Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20230408574
- Publication date Dec 21, 2023
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MONITORING A PLASMA PROCESS
- Publication number 20230317439
- Publication date Oct 5, 2023
- Samsung Electronics Co., Ltd.
- Meehyun LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRIC FIELD MEASURING APPARATUS AND METHOD OF MEASURING ELECTRIC...
- Publication number 20230194591
- Publication date Jun 22, 2023
- Samsung Electronics Co., Ltd.
- Jinyeong Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20230168278
- Publication date Jun 1, 2023
- Samsung Electronics Co., Ltd.
- Daesung Jung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA TREATMENT APPARATUS, A METHOD OF MONITORING A PROCESS OF MAN...
- Publication number 20220181219
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- MEEHYUN LIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME
- Publication number 20210156904
- Publication date May 27, 2021
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS

Meehyun Lim

Person

Patents Grantslast 30 patents

Substrate processing apparatus

Electric field measuring apparatus and method of measuring electric...

Semiconductor test device and system and test method using the same

Patents Applicationslast 30 patents

ELECTRIC FIELD MEASURING APPARATUS AND METHOD OF MEASURING ELECTRIC...

DIELECTRIC STRUCTURE AND SUBSTRATE PROCESSING APPARATUS INCLUDING T...

SEMICONDUCTOR EQUIPMENT MONITORING APPARATUS, AND SEMICONDUCTOR EQU...

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME

APPARATUS FOR MONITORING A PLASMA PROCESS

ELECTRIC FIELD MEASURING APPARATUS AND METHOD OF MEASURING ELECTRIC...

SUBSTRATE PROCESSING APPARATUS

PLASMA TREATMENT APPARATUS, A METHOD OF MONITORING A PROCESS OF MAN...

SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAME