Megumi NAKAMURA

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample holder, method for using sample holder, projection amount ad...
- Patent number 12,080,511
- Issue date Sep 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device and milling processing method using same
- Patent number 11,742,178
- Issue date Aug 29, 2023
- HITACHI HIGH-TECH CORPORATION
- Hitoshi Kamoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,697,998
- Issue date Jul 4, 2017
- Canon Anelva Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 9,373,491
- Issue date Jun 21, 2016
- Canon Anelva Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for measuring mean free path, vacuum gauge, and method for m...
- Patent number 8,436,295
- Issue date May 7, 2013
- Canon Anelva Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Grant
Ion detector for mass spectrometry, method for detecting ion, and m...
- Patent number 8,410,415
- Issue date Apr 2, 2013
- Canon Anelva Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 8,324,568
- Issue date Dec 4, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry and mass spectrometer used for the same
- Patent number 8,309,917
- Issue date Nov 13, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Internal standard material, resin composition, and measurement method
- Patent number 8,164,051
- Issue date Apr 24, 2012
- Canon Anelva Corporation
- Yoshiro Shiokawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Mass spectrometer system and mass spectrometry method
- Patent number 8,049,166
- Issue date Nov 1, 2011
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry method
- Patent number 7,952,069
- Issue date May 31, 2011
- Canon Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus
- Patent number 7,202,474
- Issue date Apr 10, 2007
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion attachment mass spectrometry apparatus
- Patent number 7,084,397
- Issue date Aug 1, 2006
- Anelva Corporation
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 7,015,461
- Issue date Mar 21, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus
- Patent number 7,005,634
- Issue date Feb 28, 2006
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for ion attachment mass spectrometry
- Patent number 6,800,848
- Issue date Oct 5, 2004
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 6,635,868
- Issue date Oct 21, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization method for mass spectrometry and mass spectrometry appar...
- Patent number 6,590,205
- Issue date Jul 8, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization apparatus and ionization method for mass spectrometry
- Patent number 6,559,443
- Issue date May 6, 2003
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source for ion attachment mass spectrometry apparatus
- Patent number 6,479,814
- Issue date Nov 12, 2002
- Anelva Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Immunostaining Method, Sample Exchange Chamber, And Charged Particl...
- Publication number 20240019346
- Publication date Jan 18, 2024
- SHOWA UNIVERSITY
- Takashi TAKAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder, Method for Using Sample Holder, Projection Amount Ad...
- Publication number 20220319802
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Megumi NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device and Milling Processing Method Using Same
- Publication number 20220293391
- Publication date Sep 15, 2022
- Hitachi High-Tech Corporation
- Hitoshi KAMOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20160240364
- Publication date Aug 18, 2016
- Canon ANELVA Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20150262807
- Publication date Sep 17, 2015
- Canon ANELVA Corporation
- Megumi NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...
- Publication number 20120235034
- Publication date Sep 20, 2012
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- G01 - MEASURING TESTING
Information Patent Application
ION DETECTOR FOR MASS SPECTROMETRY, METHOD FOR DETECTING ION, AND M...
- Publication number 20120097847
- Publication date Apr 26, 2012
- Canon ANELVA Corporation
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20100243884
- Publication date Sep 30, 2010
- Canon ANELVA Corporation
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD
- Publication number 20100163723
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME
- Publication number 20100163722
- Publication date Jul 1, 2010
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
- Publication number 20090272894
- Publication date Nov 5, 2009
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMET...
- Publication number 20090266979
- Publication date Oct 29, 2009
- CANON ANELVA TECHNIX CORPORATION
- Megumi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD
- Publication number 20090266981
- Publication date Oct 29, 2009
- CANON ANELVA TECHNIX CORPORATION
- Yoshiro Shiokawa
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Application
Ion Attachment Mass Spectrometry Apparatus
- Publication number 20060169888
- Publication date Aug 3, 2006
- ANELVA CORPORATION
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion attachment mass spectrometry apparatus
- Publication number 20040251408
- Publication date Dec 16, 2004
- ANELVA CORPORATION
- Yoshiki Hirano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization apparatus
- Publication number 20020139930
- Publication date Oct 3, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20020084408
- Publication date Jul 4, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization apparatus and ionization method for mass spectrometry
- Publication number 20020053636
- Publication date May 9, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometry apparatus
- Publication number 20020036263
- Publication date Mar 28, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization method for mass spectrometry and mass spectrometry appar...
- Publication number 20020020813
- Publication date Feb 21, 2002
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for ion attachment mass spectrometry
- Publication number 20010048074
- Publication date Dec 6, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion source for ion attachment mass spectrometry apparatus
- Publication number 20010023922
- Publication date Sep 27, 2001
- ANELVA CORPORATION
- Yoshiro Shiokawa
- H01 - BASIC ELECTRIC ELEMENTS

Megumi NAKAMURA

Person

Patents Grantslast 30 patents

Sample holder, method for using sample holder, projection amount ad...

Ion milling device and milling processing method using same

Mass spectrometer

Mass spectrometer

Device for measuring mean free path, vacuum gauge, and method for m...

Ion detector for mass spectrometry, method for detecting ion, and m...

Mass spectrometer and mass spectrometry method

Mass spectrometry and mass spectrometer used for the same

Internal standard material, resin composition, and measurement method

Mass spectrometer system and mass spectrometry method

Mass spectrometer and mass spectrometry method

Ion attachment mass spectrometry apparatus

Ion attachment mass spectrometry apparatus

Method and apparatus for ion attachment mass spectrometry

Ionization apparatus

Method and apparatus for ion attachment mass spectrometry

Mass spectrometry apparatus

Ionization method for mass spectrometry and mass spectrometry appar...

Ionization apparatus and ionization method for mass spectrometry

Ion source for ion attachment mass spectrometry apparatus

Patents Applicationslast 30 patents

Immunostaining Method, Sample Exchange Chamber, And Charged Particl...

Sample Holder, Method for Using Sample Holder, Projection Amount Ad...

Ion Milling Device and Milling Processing Method Using Same

MASS SPECTROMETER

MASS SPECTROMETER

DEVICE FOR MEASURING MEAN FREE PATH, VACUUM GAUGE, AND METHOD FOR M...

ION DETECTOR FOR MASS SPECTROMETRY, METHOD FOR DETECTING ION, AND M...

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

MASS SPECTROMETER SYSTEM AND MASS SPECTROMETRY METHOD

MASS SPECTROMETRY AND MASS SPECTROMETER USED FOR THE SAME

MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

ION ATTACHMENT MASS SPECTROMETER AND ION ATTACHMENT MASS SPECTROMET...

INTERNAL STANDARD MATERIAL, RESIN COMPOSITION, AND MEASUREMENT METHOD

Ion Attachment Mass Spectrometry Apparatus

Ion attachment mass spectrometry apparatus

Ionization apparatus

Method and apparatus for ion attachment mass spectrometry

Ionization apparatus and ionization method for mass spectrometry

Mass spectrometry apparatus

Ionization method for mass spectrometry and mass spectrometry appar...

Method and apparatus for ion attachment mass spectrometry

Ion source for ion attachment mass spectrometry apparatus