Mehdi Asghari

Person

Pasadena, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Use of waveguide arrays in LIDAR systems
- Patent number 12,099,144
- Issue date Sep 24, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system having multiple cores
- Patent number 12,066,541
- Issue date Aug 20, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Reducing amplitude variations in LIDAR system output signals
- Patent number 12,066,577
- Issue date Aug 20, 2024
- SiLC Technologies, Inc.
- Amir Ali Tavallaee
- G01 - MEASURING TESTING
Information Patent Grant
LIDAR system generating multiple lidar output signals
- Patent number 12,025,749
- Issue date Jul 2, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Concurrent LIDAR measurements of a region in a field of view
- Patent number 12,019,185
- Issue date Jun 25, 2024
- SiLC Technologies, Inc.
- Majid Boloorian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging system having multiple cores
- Patent number 11,982,748
- Issue date May 14, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Sequencing of signals in LIDAR systems
- Patent number 11,940,566
- Issue date Mar 26, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Controlling direction of LIDAR output signals
- Patent number 11,892,565
- Issue date Feb 6, 2024
- SiLC Technologies, Inc.
- Dazeng Feng
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength selection in LIDAR systems
- Patent number 11,796,651
- Issue date Oct 24, 2023
- SiLC Technologies, Inc.
- Bradley Jonathan Luff
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor system
- Patent number 11,796,677
- Issue date Oct 24, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Walk-off compensation in remote imaging systems
- Patent number 11,789,154
- Issue date Oct 17, 2023
- SiLC Technologies, Inc.
- Prakash Koonath
- G01 - MEASURING TESTING
Information Patent Grant
Polarization separation in remote imaging systems
- Patent number 11,789,149
- Issue date Oct 17, 2023
- SiLC Technologies, Inc.
- Prakash Koonath
- G02 - OPTICS
Information Patent Grant
Optical manifold for lidar applications
- Patent number 11,782,134
- Issue date Oct 10, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
LIDAR adapter for use with LIDAR chip
- Patent number 11,714,167
- Issue date Aug 1, 2023
- SiLC Technologies, Inc.
- Dazeng Feng
- G01 - MEASURING TESTING
Information Patent Grant
On-chip optical switch based on an echelle grating
- Patent number 11,714,240
- Issue date Aug 1, 2023
- SiLC Technologies, Inc.
- Shuren Hu
- G02 - OPTICS
Information Patent Grant
Reduction of sampling rates in lidar systems
- Patent number 11,714,194
- Issue date Aug 1, 2023
- SiLC Technologies, Inc.
- Majid Boloorian
- G01 - MEASURING TESTING
Information Patent Grant
Steering of LIDAR output signals
- Patent number 11,703,598
- Issue date Jul 18, 2023
- SiLC Technologies, Inc.
- Bradley Jonathan Luff
- G01 - MEASURING TESTING
Information Patent Grant
Reduction of electrical components in LIDAR systems for identifying...
- Patent number 11,698,448
- Issue date Jul 11, 2023
- SiLC Technologies, Inc.
- Bradley Jonathan Luff
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical sensor system
- Patent number 11,681,021
- Issue date Jun 20, 2023
- SiLC Technologies. Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Use of frequency offsets in generation of LIDAR data
- Patent number 11,650,317
- Issue date May 16, 2023
- SiLC Technologies, Inc.
- Majid Boloorian
- G01 - MEASURING TESTING
Information Patent Grant
Amplification of LIDAR output signals
- Patent number 11,635,491
- Issue date Apr 25, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image distance in LIDAR systems
- Patent number 11,624,807
- Issue date Apr 11, 2023
- SiLC Technologies, Inc.
- Bradley Jonathan Luff
- G01 - MEASURING TESTING
Information Patent Grant
LIDAR system with reduced speckle sensitivity
- Patent number 11,624,810
- Issue date Apr 11, 2023
- SiLC Technologies, Inc.
- Bradley Jonathan Luff
- G01 - MEASURING TESTING
Information Patent Grant
Use of common chirp periods in generation of LIDAR data
- Patent number 11,624,826
- Issue date Apr 11, 2023
- SiLC Technologies, Inc.
- Behnam Behroozpour
- G01 - MEASURING TESTING
Information Patent Grant
LIDAR output steering systems having optical gratings
- Patent number 11,579,305
- Issue date Feb 14, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
External cavity laser with a phase shifter
- Patent number 11,581,703
- Issue date Feb 14, 2023
- SiLC Technologies, Inc.
- Amir Ali Tavallaee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generation of LIDAR data
- Patent number 11,536,837
- Issue date Dec 27, 2022
- SiLC Technologies, Inc.
- Majid Boloorian
- G01 - MEASURING TESTING
Information Patent Grant
Optical switching for tuning direction of LIDAR output signals
- Patent number 11,536,805
- Issue date Dec 27, 2022
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor chip
- Patent number 11,531,090
- Issue date Dec 20, 2022
- SiLC Technologies, Inc.
- Dazeng Feng
- G02 - OPTICS
Information Patent Grant
Steering of output signals in LIDAR systems
- Patent number 11,500,071
- Issue date Nov 15, 2022
- SiLC Technologies, Inc.
- Mehdi Asghari
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
USE OF WAVEGUIDE ARRAYS IN LIDAR SYSTEMS
- Publication number 20240410988
- Publication date Dec 12, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
INCREASING RESOLUTION IN IMAGING SYSTEMS
- Publication number 20240345224
- Publication date Oct 17, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
LIDAR SYSTEM GENERATING MULTIPLE LIDAR OUTPUT SIGNALS
- Publication number 20240302508
- Publication date Sep 12, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MULTIPLE LIDAR SYSTEM OUTPUT SIGNALS
- Publication number 20240255618
- Publication date Aug 1, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL BRIDGES FOR PHOTONIC INTEGRATED CIRCUITS
- Publication number 20240241312
- Publication date Jul 18, 2024
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
BURIED TAPER WITH REFLECTING SURFACE
- Publication number 20240126011
- Publication date Apr 18, 2024
- SiLC Technologies, Inc.
- Monish Sharma
- G01 - MEASURING TESTING
Information Patent Application
COMBINING DATA FROM DIFFERENT SAMPLE REGIONS IN AN IMAGING SYSTEM F...
- Publication number 20240085559
- Publication date Mar 14, 2024
- SiLC Technologies, Inc.
- Nirmal Chindhu Warke
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLING DIRECTION OF LIDAR OUTPUT SIGNALS
- Publication number 20240061082
- Publication date Feb 22, 2024
- SiLC Technologies, Inc.
- Dazeng Feng
- G02 - OPTICS
Information Patent Application
IMAGING SYTEM WITH ENHANCED SCAN RATE
- Publication number 20240012112
- Publication date Jan 11, 2024
- SiLC Technologies, Inc.
- Nirmal Chindhu Warke
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM USING LIGHT SOURCE WITH TUNABLE ELECTRO-OPTICS
- Publication number 20240012147
- Publication date Jan 11, 2024
- SiLC Technologies, Inc.
- Amir Ali Tavallaee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR POLARIZATION SEPARATION IN REMOTE IMAGING S...
- Publication number 20230417910
- Publication date Dec 28, 2023
- SiLC Technologies, Inc.
- Prakash Koonath
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM HAVING REDUCED ADC SAMPLING RATES
- Publication number 20230288567
- Publication date Sep 14, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
IDENTIFICATION OF MATERIALS ILLUMINATED BY LIDAR SYSTEMS
- Publication number 20230251360
- Publication date Aug 10, 2023
- SiLC Technologies, Inc.
- Bradley Jonathan Luff
- G01 - MEASURING TESTING
Information Patent Application
USE OF FREQUENCY OFFSETS IN GENERATION OF LIDAR DATA
- Publication number 20230251378
- Publication date Aug 10, 2023
- SiLC Technologies, Inc.
- Majid Boloorian
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM HAVING MULTIPLE CORES
- Publication number 20230228877
- Publication date Jul 20, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYTEM HAVING MULTIPLE CORES
- Publication number 20230228878
- Publication date Jul 20, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
INCREASING RATE OF LIDAR MEASUREMENTS
- Publication number 20230104453
- Publication date Apr 6, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
USE OF MULTIPLE STEERING MECHANISMS IN SCANNING
- Publication number 20230069201
- Publication date Mar 2, 2023
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP OPTICAL SWITCH BASED ON AN ECHELLE GRATING
- Publication number 20220413224
- Publication date Dec 29, 2022
- SiLC Technologies, Inc.
- Shuren Hu
- G02 - OPTICS
Information Patent Application
SCANNING MULTIPLE LIDAR SYSTEM OUTPUT SIGNALS
- Publication number 20220404470
- Publication date Dec 22, 2022
- SiLC Technologies, Inc.
- Mehdi Asghari
- G02 - OPTICS
Information Patent Application
Optical Switching for Tuning Direction of LIDAR Output Signals
- Publication number 20220342048
- Publication date Oct 27, 2022
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
USE OF CIRCULATOR IN LIDAR SYSTEM
- Publication number 20220291361
- Publication date Sep 15, 2022
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP OPTICAL SWITCH BASED ON AN ECHELLE GRATING
- Publication number 20220221652
- Publication date Jul 14, 2022
- SiLC Technologies, Inc.
- Shuren Hu
- G02 - OPTICS
Information Patent Application
ON-CHIP POLARIZATION CONTROL
- Publication number 20220163721
- Publication date May 26, 2022
- SiLC Technologies, Inc.
- Shuren Hu
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION SEPARATION IN REMOTE IMAGING SYSTEMS
- Publication number 20220107411
- Publication date Apr 7, 2022
- SiLC Technologies, Inc.
- Prakash Koonath
- G01 - MEASURING TESTING
Information Patent Application
EXTERNAL CAVITY LASER WITH A PHASE SHIFTER
- Publication number 20220094140
- Publication date Mar 24, 2022
- SiLC Technologies, Inc.
- Amir Ali Tavallaee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Walk-Off Compensation In Remote Imaging Systems
- Publication number 20220018963
- Publication date Jan 20, 2022
- SiLC Technologies, Inc.
- Prakash Koonath
- G01 - MEASURING TESTING
Information Patent Application
SEQUENCING OF SIGNALS IN LIDAR SYSTEMS
- Publication number 20220011416
- Publication date Jan 13, 2022
- SiLC Technologies, Inc.
- Mehdi Asghari
- G01 - MEASURING TESTING
Information Patent Application
REDUCING AMPLITUDE VARIATIONS IN LIDAR SYSTEM OUTPUT SIGNALS
- Publication number 20210349197
- Publication date Nov 11, 2021
- SiLC Technologies, Inc.
- Amir Ali Tavallaee
- G01 - MEASURING TESTING
Information Patent Application
USE OF COMMON CHIRP PERIODS IN GENERATION OF LIDAR DATA
- Publication number 20210349216
- Publication date Nov 11, 2021
- SiLC Technologies, Inc.
- Behnam Behroozpour
- G01 - MEASURING TESTING

Mehdi Asghari

Person

Patents Grantslast 30 patents

Use of waveguide arrays in LIDAR systems

Imaging system having multiple cores

Reducing amplitude variations in LIDAR system output signals

LIDAR system generating multiple lidar output signals

Concurrent LIDAR measurements of a region in a field of view

Imaging system having multiple cores

Sequencing of signals in LIDAR systems

Controlling direction of LIDAR output signals

Wavelength selection in LIDAR systems

Optical sensor system

Walk-off compensation in remote imaging systems

Polarization separation in remote imaging systems

Optical manifold for lidar applications

LIDAR adapter for use with LIDAR chip

On-chip optical switch based on an echelle grating

Reduction of sampling rates in lidar systems

Steering of LIDAR output signals

Reduction of electrical components in LIDAR systems for identifying...

Optical sensor system

Use of frequency offsets in generation of LIDAR data

Amplification of LIDAR output signals

Image distance in LIDAR systems

LIDAR system with reduced speckle sensitivity

Use of common chirp periods in generation of LIDAR data

LIDAR output steering systems having optical gratings

External cavity laser with a phase shifter

Generation of LIDAR data

Optical switching for tuning direction of LIDAR output signals

Optical sensor chip

Steering of output signals in LIDAR systems

Patents Applicationslast 30 patents

USE OF WAVEGUIDE ARRAYS IN LIDAR SYSTEMS

INCREASING RESOLUTION IN IMAGING SYSTEMS

LIDAR SYSTEM GENERATING MULTIPLE LIDAR OUTPUT SIGNALS

SCANNING MULTIPLE LIDAR SYSTEM OUTPUT SIGNALS

OPTICAL BRIDGES FOR PHOTONIC INTEGRATED CIRCUITS

BURIED TAPER WITH REFLECTING SURFACE

COMBINING DATA FROM DIFFERENT SAMPLE REGIONS IN AN IMAGING SYSTEM F...

CONTROLLING DIRECTION OF LIDAR OUTPUT SIGNALS

IMAGING SYTEM WITH ENHANCED SCAN RATE

IMAGING SYSTEM USING LIGHT SOURCE WITH TUNABLE ELECTRO-OPTICS

SYSTEMS AND METHODS FOR POLARIZATION SEPARATION IN REMOTE IMAGING S...

IMAGING SYSTEM HAVING REDUCED ADC SAMPLING RATES

IDENTIFICATION OF MATERIALS ILLUMINATED BY LIDAR SYSTEMS

USE OF FREQUENCY OFFSETS IN GENERATION OF LIDAR DATA

IMAGING SYSTEM HAVING MULTIPLE CORES

IMAGING SYTEM HAVING MULTIPLE CORES

INCREASING RATE OF LIDAR MEASUREMENTS

USE OF MULTIPLE STEERING MECHANISMS IN SCANNING

ON-CHIP OPTICAL SWITCH BASED ON AN ECHELLE GRATING

SCANNING MULTIPLE LIDAR SYSTEM OUTPUT SIGNALS

Optical Switching for Tuning Direction of LIDAR Output Signals

USE OF CIRCULATOR IN LIDAR SYSTEM

ON-CHIP OPTICAL SWITCH BASED ON AN ECHELLE GRATING

ON-CHIP POLARIZATION CONTROL

POLARIZATION SEPARATION IN REMOTE IMAGING SYSTEMS

EXTERNAL CAVITY LASER WITH A PHASE SHIFTER

Walk-Off Compensation In Remote Imaging Systems

SEQUENCING OF SIGNALS IN LIDAR SYSTEMS

REDUCING AMPLITUDE VARIATIONS IN LIDAR SYSTEM OUTPUT SIGNALS

USE OF COMMON CHIRP PERIODS IN GENERATION OF LIDAR DATA