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Mehdi Rostami
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Covilha, PT
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last 30 patents
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Patent Application
Semiconductor device test method and device
Publication number
20070132475
Publication date
Jun 14, 2007
Ana Maria Sa Carneiro Leao
G01 - MEASURING TESTING
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Patent Application
Method for testing a circuit unit and test apparatus
Publication number
20060181300
Publication date
Aug 17, 2006
Bjorn Flach
G01 - MEASURING TESTING