Mehdi Vaez-lravani

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Los Gatos, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
HIGH SENSITIVITY IMAGE-BASED REFLECTOMETRY
- Publication number 20210302149
- Publication date Sep 30, 2021
- Applied Materials, Inc.
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
IMAGING REFLECTOMETER
- Publication number 20200355609
- Publication date Nov 12, 2020
- Appiied Materials, Inc,
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Application
Monitoring System For Deposition And Method Of Operation Thereof
- Publication number 20180114711
- Publication date Apr 26, 2018
- Applied Materials, Inc.
- Edward W. Budiarto
- H01 - BASIC ELECTRIC ELEMENTS