Mehmet Aslan

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Sensing capacitor with a permeable electrode
- Patent number 10,801,985
- Issue date Oct 13, 2020
- Texas Instruments Incorporated
- Benjamin Stassen Cook
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Low noise, high CMRR and PSRR input buffer
- Patent number 8,330,537
- Issue date Dec 11, 2012
- National Semiconductor Corporation
- Gururaj Ghorpade
- G01 - MEASURING TESTING
Information Patent Grant
Beta variation cancellation in temperature sensors
- Patent number 8,021,042
- Issue date Sep 20, 2011
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for white level calibration
- Patent number 7,889,251
- Issue date Feb 15, 2011
- National Semiconductor Corporation
- Chung Wai Ng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Three-terminal dual-diode system for fully differential remote temp...
- Patent number 7,828,479
- Issue date Nov 9, 2010
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Background calibration method for analog-to-digital converters
- Patent number 7,825,837
- Issue date Nov 2, 2010
- National Semiconductor Corporation
- Priyanka Khasnis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Capacitor rotation method for removing gain error in sigma-delta an...
- Patent number 7,825,838
- Issue date Nov 2, 2010
- National Semiconductor Corporation
- Theertham Srinivas
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Beta variation cancellation in temperature sensors
- Patent number 7,766,546
- Issue date Aug 3, 2010
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Matching for time multiplexed transistors
- Patent number 7,541,861
- Issue date Jun 2, 2009
- National Semiconductor Corporation
- Mehmet Aslan
- G05 - CONTROLLING REGULATING
Information Patent Grant
Beta variation cancellation in temperature sensors
- Patent number 7,461,974
- Issue date Dec 9, 2008
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Matching for time multiplexed resistors
- Patent number 7,449,943
- Issue date Nov 11, 2008
- National Semiconductor Corporation
- Mehmet Aslan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Eliminating the effects of the temperature coefficients of series r...
- Patent number 7,333,038
- Issue date Feb 19, 2008
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for calibration of a temperature sensor
- Patent number 7,309,157
- Issue date Dec 18, 2007
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for adjusting parameters of a temperature senso...
- Patent number 7,304,272
- Issue date Dec 4, 2007
- National Semiconductor Corporation
- Dan D'Aquino
- G01 - MEASURING TESTING
Information Patent Grant
Efficient method of sharing diode pins on multi-channel remote diod...
- Patent number 7,252,432
- Issue date Aug 7, 2007
- National Semiconductor Corporation
- Richard Henderson
- G01 - MEASURING TESTING
Information Patent Grant
Base current cancellation for bipolar junction transistor current s...
- Patent number 7,230,472
- Issue date Jun 12, 2007
- National Semiconductor Corporation
- Eric Scheuerlein
- G01 - MEASURING TESTING
Information Patent Grant
Zero temperature coefficient (TC) current source for diode measurement
- Patent number 7,150,561
- Issue date Dec 19, 2006
- National Semiconductor Corporation
- Dan D'Aquino
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for sub-ranging conversion for temperature sen...
- Patent number 7,089,146
- Issue date Aug 8, 2006
- National Semiconductor Corporation
- Dan D'Aquino
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for error cancellation for dual diode remote temperature...
- Patent number 7,082,377
- Issue date Jul 25, 2006
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Short circuit protection
- Patent number 7,031,127
- Issue date Apr 18, 2006
- National Semiconductor Corporation
- Danny D'Aquino
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Output buffer
- Patent number 6,992,512
- Issue date Jan 31, 2006
- National Semiconductor Corporation
- Danny D'Aquino
- G11 - INFORMATION STORAGE
Information Patent Grant
Time-interleaved sampling of voltages for improving accuracy of tem...
- Patent number 6,808,307
- Issue date Oct 26, 2004
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Fan speed detection in the presence of PWM speed control
- Patent number 6,778,938
- Issue date Aug 17, 2004
- National Semiconductor Corporation
- Chungwai Benedict Ng
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Dual threshold buffer with hysteresis
- Patent number 6,774,676
- Issue date Aug 10, 2004
- National Semiconductor Corporation
- Mehmet Aslan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High resolution fan control at high PWM frequency with a low clock...
- Patent number 6,765,422
- Issue date Jul 20, 2004
- National Semiconductor Corporation
- Mehmet Aslan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Nonlinear fan control
- Patent number 6,757,592
- Issue date Jun 29, 2004
- National Semiconductor Corporation
- Richard Dean Henderson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fan acceleration control
- Patent number 6,737,824
- Issue date May 18, 2004
- National Semiconductor Corporation
- Mehmet Aslan
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Constant offset buffer for reducing sampling time in a semiconducto...
- Patent number 6,637,934
- Issue date Oct 28, 2003
- National Semiconductor Corporation
- Richard Dean Henderson
- G01 - MEASURING TESTING
Information Patent Grant
Input sub-ranging converter system for sampling semiconductor tempe...
- Patent number 6,480,127
- Issue date Nov 12, 2002
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel remote diode temperature sensor
- Patent number 6,332,710
- Issue date Dec 25, 2001
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sensing Capacitor with a Permeable Electrode
- Publication number 20170350846
- Publication date Dec 7, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Benjamin Stassen Cook
- G01 - MEASURING TESTING
Information Patent Application
BETA VARIATION CANCELLATION IN TEMPERATURE SENSORS
- Publication number 20070237207
- Publication date Oct 11, 2007
- National Semiconductor Corporation
- Mehmet Aslan
- G01 - MEASURING TESTING

Mehmet Aslan

Person

Patents Grantslast 30 patents

Sensing capacitor with a permeable electrode

Low noise, high CMRR and PSRR input buffer

Beta variation cancellation in temperature sensors

Method and device for white level calibration

Three-terminal dual-diode system for fully differential remote temp...

Background calibration method for analog-to-digital converters

Capacitor rotation method for removing gain error in sigma-delta an...

Beta variation cancellation in temperature sensors

Matching for time multiplexed transistors

Beta variation cancellation in temperature sensors

Matching for time multiplexed resistors

Eliminating the effects of the temperature coefficients of series r...

Apparatus and method for calibration of a temperature sensor

Systems and methods for adjusting parameters of a temperature senso...

Efficient method of sharing diode pins on multi-channel remote diod...

Base current cancellation for bipolar junction transistor current s...

Zero temperature coefficient (TC) current source for diode measurement

Apparatus and method for sub-ranging conversion for temperature sen...

Apparatus for error cancellation for dual diode remote temperature...

Short circuit protection

Output buffer

Time-interleaved sampling of voltages for improving accuracy of tem...

Fan speed detection in the presence of PWM speed control

Dual threshold buffer with hysteresis

High resolution fan control at high PWM frequency with a low clock...

Nonlinear fan control

Fan acceleration control

Constant offset buffer for reducing sampling time in a semiconducto...

Input sub-ranging converter system for sampling semiconductor tempe...

Multi-channel remote diode temperature sensor

Patents Applicationslast 30 patents

Sensing Capacitor with a Permeable Electrode

BETA VARIATION CANCELLATION IN TEMPERATURE SENSORS