Mehmet Nejat Tek

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Quincy, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Threshold determination in an inspection system
- Patent number 8,260,035
- Issue date Sep 4, 2012
- KLA-Tencor Corporation
- Mehmet Tek
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring jitter
- Patent number 7,590,170
- Issue date Sep 15, 2009
- Teradyne, Inc.
- Mehmet Nejat Tek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
System and method for defect detection threshold determination in a...
- Publication number 20080075353
- Publication date Mar 27, 2008
- Mehmet Tek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring jitter
- Publication number 20060067390
- Publication date Mar 30, 2006
- Teradyne, Inc.
- Mehmet Nejat Tek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE