Mehran Amerian

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Campbell, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Edge-triggered scan flip-flop and one-pass scan synthesis methodology
- Patent number 6,389,566
- Issue date May 14, 2002
- S3 Incorporated
- Kenneth D. Wagner
- G01 - MEASURING TESTING
Information Patent Grant
Multiple input signature testing & diagnosis for embedded blocks in...
- Patent number 6,158,033
- Issue date Dec 5, 2000
- S3 Incorporated
- Kenneth D. Wagner
- G01 - MEASURING TESTING
Information Patent Grant
Using power-on mode to control test mode
- Patent number 6,075,396
- Issue date Jun 13, 2000
- S3 Incorporated
- Mehran Amerian
- G01 - MEASURING TESTING