Mei-Mei SU

Person

Mountain View, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Universal test interface systems and methods
- Patent number 12,140,609
- Issue date Nov 12, 2024
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment with hardware accelerator
- Patent number 12,079,098
- Issue date Sep 3, 2024
- Advantest Corporation
- Mei-Mei Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software directed firmware acceleration
- Patent number 12,055,581
- Issue date Aug 6, 2024
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device interface board supporting devices with multiple different s...
- Patent number 11,860,229
- Issue date Jan 2, 2024
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Test equipment diagnostics systems and methods
- Patent number 11,714,132
- Issue date Aug 1, 2023
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced loopback diagnostic systems and methods
- Patent number 11,619,667
- Issue date Apr 4, 2023
- Advantest Corporation
- Mei-Mei Su
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test system and method
- Patent number 11,099,228
- Issue date Aug 24, 2021
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquisition of test data
- Patent number 11,041,907
- Issue date Jun 22, 2021
- Advantest Corporation
- Ben Rogel-Favila
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture with an FPGA based test board to simulate a DUT o...
- Patent number 11,009,550
- Issue date May 18, 2021
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scalable platform for system level testing
- Patent number 11,002,787
- Issue date May 11, 2021
- Advantest Corporation
- Roland Wolff
- G01 - MEASURING TESTING
Information Patent Grant
Traffic capture and debugging tools for identifying root causes of...
- Patent number 10,929,260
- Issue date Feb 23, 2021
- Advantest Corporation
- Linden Hsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for acquisition of test data
- Patent number 10,634,723
- Issue date Apr 28, 2020
- Advantest Corporation
- Ben Rogel-Favila
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture with a small form factor test board for rapid pro...
- Patent number 10,288,681
- Issue date May 14, 2019
- Advantest Corporation
- Duane Champoux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test system and method
- Patent number 10,241,146
- Issue date Mar 26, 2019
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Grant
Test architecture having multiple FPGA based hardware accelerator b...
- Patent number 10,162,007
- Issue date Dec 25, 2018
- Advantest Corporation
- Gerald Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Universal test floor system
- Patent number 9,933,454
- Issue date Apr 3, 2018
- Advantest Corporation
- Ben Rogel-Favila
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
High speed tester communication interface between test slice and trays
- Patent number 9,310,427
- Issue date Apr 12, 2016
- Advantest Corporation
- Eric Kushnick
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic mask memory for serial scan testing
- Patent number 7,865,788
- Issue date Jan 4, 2011
- Verigy (Singapore) Pte. Ltd.
- Phillip D. Burlison
- G01 - MEASURING TESTING
Information Patent Grant
Multiple score language processing system
- Patent number 5,418,717
- Issue date May 23, 1995
- Keh-Yih Su
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SELF-RESET TESTING SYSTEMS AND METHODS
- Publication number 20240201251
- Publication date Jun 20, 2024
- Advantest Corporation
- Camilo Montenegro
- G01 - MEASURING TESTING
Information Patent Application
PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS
- Publication number 20240118340
- Publication date Apr 11, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...
- Publication number 20240094287
- Publication date Mar 21, 2024
- Advantest Corporation
- Edmundo De La Puente
- G01 - MEASURING TESTING
Information Patent Application
Test Equipment Diagnostics Systems and Methods
- Publication number 20210302501
- Publication date Sep 30, 2021
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
Universal Test Interface Systems and Methods
- Publication number 20210302469
- Publication date Sep 30, 2021
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED LOOPBACK DIAGNOSTIC SYSTEMS AND METHODS
- Publication number 20210302498
- Publication date Sep 30, 2021
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INTERFACE BOARD SUPPORTING DEVICES WITH MULITPLE DIFFERENT S...
- Publication number 20210278462
- Publication date Sep 9, 2021
- Advantest Corporation
- Mei-Mei SU
- G01 - MEASURING TESTING
Information Patent Application
SOFTWARE AND FIRMWARE SUPPORT FOR DEVICE INTERFACE BOARD CONFIGURED...
- Publication number 20210278458
- Publication date Sep 9, 2021
- Mei-Mei SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOFTWARE DIRECTED FIRMWARE ACCELERATION
- Publication number 20210116494
- Publication date Apr 22, 2021
- Advantest Corporation
- Duane CHAMPOUX
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USE OF HOST BUS ADAPTER TO PROVIDE PROTOCOL FLEXIBILITY IN AUTOMATE...
- Publication number 20210117298
- Publication date Apr 22, 2021
- Advantest Corporation
- Mei-Mei SU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ACQUISITION OF TEST DATA
- Publication number 20200033408
- Publication date Jan 30, 2020
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
TRAFFIC CAPTURE AND DEBUGGING TOOLS FOR IDENTIFYING ROOT CAUSES OF...
- Publication number 20190354453
- Publication date Nov 21, 2019
- Advantest Corporation
- Linden Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOG POST-PROCESSOR FOR IDENTIFYING ROOT CAUSES OF DEVICE FAILURE DU...
- Publication number 20190278645
- Publication date Sep 12, 2019
- Advantest Corporation
- Linden HSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCALABLE PLATFORM FOR SYSTEM LEVEL TESTING
- Publication number 20190277907
- Publication date Sep 12, 2019
- Advantest Corporation
- Roland WOLFF
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD
- Publication number 20180313889
- Publication date Nov 1, 2018
- Advantest Corporation
- Mei-Mei SU
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE WITH A SMALL FORM FACTOR TEST BOARD FOR RAPID PRO...
- Publication number 20180267101
- Publication date Sep 20, 2018
- Advantest Corporation
- Duane CHAMPOUX
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD
- Publication number 20180259572
- Publication date Sep 13, 2018
- Advantest Corporation
- Mei-Mei Su
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE WITH AN FPGA BASED TEST BOARD TO SIMULATE A DUT O...
- Publication number 20180196103
- Publication date Jul 12, 2018
- Duane CHAMPOUX
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ACQUISITION OF TEST DATA
- Publication number 20180188322
- Publication date Jul 5, 2018
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL TEST FLOOR SYSTEM
- Publication number 20150355229
- Publication date Dec 10, 2015
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED TESTER COMMUNICATION INTERFACE BETWEEN TEST SLICE AND TRAYS
- Publication number 20150028908
- Publication date Jan 29, 2015
- Advantest Corporation
- Eric KUSHNICK
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE HAVING MULTIPLE FPGA BASED HARDWARE ACCELERATOR B...
- Publication number 20140236525
- Publication date Aug 21, 2014
- Advantest Corporation
- Gerald CHAN
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING
- Publication number 20090132870
- Publication date May 21, 2009
- Inovys Corporation
- PHILLIP BURLISON
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Universal test interface systems and methods

Automated test equipment with hardware accelerator

Software directed firmware acceleration

Device interface board supporting devices with multiple different s...

Test equipment diagnostics systems and methods

Enhanced loopback diagnostic systems and methods

Test system and method

Method and system for acquisition of test data

Test architecture with an FPGA based test board to simulate a DUT o...

Scalable platform for system level testing

Traffic capture and debugging tools for identifying root causes of...

Method and system for acquisition of test data

Test architecture with a small form factor test board for rapid pro...

Test system and method

Test architecture having multiple FPGA based hardware accelerator b...

Universal test floor system

High speed tester communication interface between test slice and trays

Dynamic mask memory for serial scan testing

Multiple score language processing system

Patents Applicationslast 30 patents

SELF-RESET TESTING SYSTEMS AND METHODS

PROCESSOR TEST PATTERN GENERATION AND APPLICATION FOR TESTER SYSTEMS

LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW PO...

Test Equipment Diagnostics Systems and Methods

Universal Test Interface Systems and Methods

ENHANCED LOOPBACK DIAGNOSTIC SYSTEMS AND METHODS

DEVICE INTERFACE BOARD SUPPORTING DEVICES WITH MULITPLE DIFFERENT S...

SOFTWARE AND FIRMWARE SUPPORT FOR DEVICE INTERFACE BOARD CONFIGURED...

SOFTWARE DIRECTED FIRMWARE ACCELERATION

USE OF HOST BUS ADAPTER TO PROVIDE PROTOCOL FLEXIBILITY IN AUTOMATE...

METHOD AND SYSTEM FOR ACQUISITION OF TEST DATA

TRAFFIC CAPTURE AND DEBUGGING TOOLS FOR IDENTIFYING ROOT CAUSES OF...

LOG POST-PROCESSOR FOR IDENTIFYING ROOT CAUSES OF DEVICE FAILURE DU...

SCALABLE PLATFORM FOR SYSTEM LEVEL TESTING

TEST SYSTEM AND METHOD

TEST ARCHITECTURE WITH A SMALL FORM FACTOR TEST BOARD FOR RAPID PRO...

TEST SYSTEM AND METHOD

TEST ARCHITECTURE WITH AN FPGA BASED TEST BOARD TO SIMULATE A DUT O...

METHOD AND SYSTEM FOR ACQUISITION OF TEST DATA

UNIVERSAL TEST FLOOR SYSTEM

HIGH SPEED TESTER COMMUNICATION INTERFACE BETWEEN TEST SLICE AND TRAYS

TEST ARCHITECTURE HAVING MULTIPLE FPGA BASED HARDWARE ACCELERATOR B...

DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING