Membership
Tour
Register
Log in
Mei-Shu Hsu
Follow
Person
Pa-The City, TW
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for probing multiple integrated circuit devices
Patent number
7,436,171
Issue date
Oct 14, 2008
Star Technologies, Inc.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card
Patent number
7,295,023
Issue date
Nov 13, 2007
Star Technologies Inc.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card with tunable stage and at least one replaceable probe
Patent number
7,253,646
Issue date
Aug 7, 2007
Star Technologies Inc.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card for electrical testing a chip in a wide temperature range
Patent number
6,906,543
Issue date
Jun 14, 2005
Star Technologies Inc.
Choon-Leong Lou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Apparatus for probing multiple integrated circuit devices
Publication number
20080074121
Publication date
Mar 27, 2008
STAR TECHNOLOGIES, INC.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD FOR INTEGRATED CIRCUITS
Publication number
20070069745
Publication date
Mar 29, 2007
STAR TECHNOLOGIES INC.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD
Publication number
20060186908
Publication date
Aug 24, 2006
Star Technologies Inc.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for probing multiple integrated circuit devices
Publication number
20050280427
Publication date
Dec 22, 2005
STAR TECHNOLOGIES INC.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD
Publication number
20050174133
Publication date
Aug 11, 2005
STAR TECHNOLOGIES INC.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Application
Probe card for testing a semiconductor
Publication number
20040119463
Publication date
Jun 24, 2004
Star Technologies Inc.
Choon-Leong Lou
G01 - MEASURING TESTING
Information
Patent Application
Probe card and method for manufacturing the same
Publication number
20030122563
Publication date
Jul 3, 2003
Choon-Leong Lou
G01 - MEASURING TESTING