Meier Brender

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 10,060,884
- Issue date Aug 28, 2018
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,645,093
- Issue date May 9, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 9,395,340
- Issue date Jul 19, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,176,069
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20160290971
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20160054232
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20140260640
- Publication date Sep 18, 2014
- KLA-Tencor Corporation Drive
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20140016125
- Publication date Jan 16, 2014
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS