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Meindert Martin Lunenborg
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St Gely du Fesc, FR
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last 30 patents
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Patent Grant
Test structures for measuring silicon thickness in fully depleted s...
Patent number
10,852,337
Issue date
Dec 1, 2020
PDF Solutions, Inc.
Sharad Saxena
G01 - MEASURING TESTING
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Patent Grant
Passive array test structure for cross-point memory characterization
Patent number
10,643,735
Issue date
May 5, 2020
PDF Solutions, Inc.
Tomasz Brozek
G11 - INFORMATION STORAGE
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Patent Grant
Test structures and methods for measuring silicon thickness in full...
Patent number
9,691,669
Issue date
Jun 27, 2017
PDF Solutions, Inc.
Sharad Saxena
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED S...
Publication number
20170309524
Publication date
Oct 26, 2017
PDF Solutions, Inc.
Sharad Saxena
G01 - MEASURING TESTING