Melvin Khoo

Person

San Gabriel, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe for testing semiconductor devices
- Patent number 8,344,748
- Issue date Jan 1, 2013
- Advantest America, Inc
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Probecard system and method
- Patent number 8,278,956
- Issue date Oct 2, 2012
- Advantest America, Inc
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Grant
Post and tip design for a probe contact
- Patent number 7,922,888
- Issue date Apr 12, 2011
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing semiconductor devices with features that increase...
- Patent number 7,772,859
- Issue date Aug 10, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Torsion spring probe contactor design
- Patent number 7,724,010
- Issue date May 25, 2010
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid probe for testing semiconductor devices
- Patent number 7,589,542
- Issue date Sep 15, 2009
- Touchdown Technologies Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with balanced lateral force
- Patent number 7,538,567
- Issue date May 26, 2009
- Touchdown Technologies, Inc.
- Shaoning Lu
- G01 - MEASURING TESTING
Information Patent Grant
Torsion spring probe contactor design
- Patent number 7,362,119
- Issue date Apr 22, 2008
- Touchdown Technologies, Inc.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Grant
Process for forming microstructures
- Patent number 7,271,022
- Issue date Sep 18, 2007
- Touchdown Technologies, Inc.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Process for forming MEMS
- Patent number 7,264,984
- Issue date Sep 4, 2007
- Touchdown Technologies, Inc.
- Raffi Garabedian
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Post and tip design for a probe contact
- Patent number 7,245,135
- Issue date Jul 17, 2007
- Touchdown Technologies, Inc.
- Salleh Ismail
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20120032697
- Publication date Feb 9, 2012
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Probecard System and Method
- Publication number 20110248735
- Publication date Oct 13, 2011
- TOUCHDOWN TECHNOLOGIES, INC.
- Matt Losey
- G01 - MEASURING TESTING
Information Patent Application
HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252310
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Nim Tea
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080252328
- Publication date Oct 16, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Zhiyong An
- G01 - MEASURING TESTING
Information Patent Application
Torsion spring probe contactor design
- Publication number 20080106289
- Publication date May 8, 2008
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Probe Card with Balanced Lateral Force
- Publication number 20080012594
- Publication date Jan 17, 2008
- Shaoning Lu
- G01 - MEASURING TESTING
Information Patent Application
Post and tip design for a probe contact
- Publication number 20070240306
- Publication date Oct 18, 2007
- TOUCHDOWN TECHNOLOGIES., INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Post and tip design for a probe contact
- Publication number 20070024297
- Publication date Feb 1, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Salleh Ismail
- G01 - MEASURING TESTING
Information Patent Application
Torsion spring probe contactor design
- Publication number 20070024298
- Publication date Feb 1, 2007
- TOUCHDOWN TECHNOLOGIES, INC.
- Melvin Khoo
- G01 - MEASURING TESTING
Information Patent Application
Process for forming microstructures
- Publication number 20060134820
- Publication date Jun 22, 2006
- TOUCHDOWN TECHNOLOGIES, INC.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Process for forming MEMS
- Publication number 20060134819
- Publication date Jun 22, 2006
- Integrated Micromachines, Inc.
- Weilong Tang
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Melvin Khoo

Person

Patents Grantslast 30 patents

Probe for testing semiconductor devices

Probecard system and method

Post and tip design for a probe contact

Probe for testing semiconductor devices with features that increase...

Torsion spring probe contactor design

Hybrid probe for testing semiconductor devices

Probe card with balanced lateral force

Torsion spring probe contactor design

Process for forming microstructures

Process for forming MEMS

Post and tip design for a probe contact

Patents Applicationslast 30 patents

PROBE FOR TESTING SEMICONDUCTOR DEVICES

Probecard System and Method

HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES

PROBE FOR TESTING SEMICONDUCTOR DEVICES

Torsion spring probe contactor design

Probe Card with Balanced Lateral Force

Post and tip design for a probe contact

Post and tip design for a probe contact

Torsion spring probe contactor design

Process for forming microstructures

Process for forming MEMS