MENACHEM REGENSBURGER

Person

SHIMSHIT, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 11,828,713
- Issue date Nov 28, 2023
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic defect classification
- Patent number 11,300,521
- Issue date Apr 12, 2022
- Camtek Ltd.
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hierarchical wafer inspection
- Patent number 10,732,128
- Issue date Aug 4, 2020
- Menachem Regensburger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens
- Patent number 10,598,607
- Issue date Mar 24, 2020
- Camtek Ltd.
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Continuous light inspection
- Patent number 10,497,092
- Issue date Dec 3, 2019
- Camtek Ltd.
- Shimon Koren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and a method for inspecting a diced wafer
- Patent number 10,203,289
- Issue date Feb 12, 2019
- Camtek Ltd.
- Yuri Postolov
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a wafer using image and design information
- Patent number 10,042,974
- Issue date Aug 7, 2018
- Camtek Ltd.
- Yuri Postolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High throughput and low cost height triangulation system and method
- Patent number 9,756,313
- Issue date Sep 5, 2017
- Camtek Ltd.
- Shimon Koren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection recipe generation and inspection based on an inspection...
- Patent number 8,699,784
- Issue date Apr 15, 2014
- Camtek Ltd.
- Eldad Langmatz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspection
- Patent number 8,290,243
- Issue date Oct 16, 2012
- Camtek Ltd.
- Michael Lev
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and a method for detecting defects based upon a r...
- Patent number 8,238,645
- Issue date Aug 7, 2012
- Camtek Ltd.
- Yuri Postolov
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and a method for detecting defects based upon a r...
- Patent number 8,233,699
- Issue date Jul 31, 2012
- Camtek Ltd.
- Yuri Postolov
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting a diced wafer
- Patent number 8,208,713
- Issue date Jun 26, 2012
- Camtek Ltd.
- Yuri Postolov
- G01 - MEASURING TESTING
Information Patent Grant
Method for establishing a wafer testing recipe
- Patent number 8,089,058
- Issue date Jan 3, 2012
- Camtek Ltd.
- Menachem Regensburger
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSP...
- Publication number 20240003826
- Publication date Jan 4, 2024
- CAMTEK LTD
- Carmel Yehuda DRILLMAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC DEFECT CLASSIFICATION
- Publication number 20220214287
- Publication date Jul 7, 2022
- Camtek LTD.
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Migdal Haemeq
- Publication number 20200141879
- Publication date May 7, 2020
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIERARCHICAL WAFER INSPECTION
- Publication number 20190128822
- Publication date May 2, 2019
- CAMTEK LTD
- Menachem Regensburger
- G01 - MEASURING TESTING
Information Patent Application
OBJECTIVE LENS
- Publication number 20190033234
- Publication date Jan 31, 2019
- CAMTEK LTD
- Zehava Ben Ezer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTING A WAFER USING IMAGE AND DESIGN INFORMATION
- Publication number 20170344697
- Publication date Nov 30, 2017
- Yuri Postolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTINUOUS LIGHT INSPECTION
- Publication number 20170150104
- Publication date May 25, 2017
- CAMTEK LTD
- SHIMON KOREN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD
- Publication number 20140362208
- Publication date Dec 11, 2014
- CAMTEK LTD
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION...
- Publication number 20120057773
- Publication date Mar 8, 2012
- CAMTEK LTD
- ELDAD LANGMATZ
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND A SYSTEM FOR CREATING A REFERENCE IMAGE USING UNKNOWN QU...
- Publication number 20110164129
- Publication date Jul 7, 2011
- Camtek LTD.
- Yuri Postolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION
- Publication number 20100245566
- Publication date Sep 30, 2010
- Camtek LTD.
- MICHAEL LEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMAGING AN ELECTRICAL CIRCUIT
- Publication number 20100194877
- Publication date Aug 5, 2010
- Menachem Regensburger
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND A METHOD FOR DETECTING DEFECTS BASED UPON A R...
- Publication number 20090304260
- Publication date Dec 10, 2009
- Yuri Postolov
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND A SYSTEM FOR ESTABLISHING AN INSPECTION-RECIPE
- Publication number 20090290782
- Publication date Nov 26, 2009
- Menachem Regensburger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for inspecting a diced wafer
- Publication number 20090116726
- Publication date May 7, 2009
- CAMTEK LTD
- Yuri Postolov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection System and a Method for Detecting Defects Based Upon a R...
- Publication number 20090110260
- Publication date Apr 30, 2009
- Camtek LTD.
- Yuri Postolov
- G01 - MEASURING TESTING

MENACHEM REGENSBURGER

Person

Patents Grantslast 30 patents

Semiconductor inspection tool system and method for wafer edge insp...

Automatic defect classification

Hierarchical wafer inspection

Objective lens

Continuous light inspection

Inspection system and a method for inspecting a diced wafer

Inspecting a wafer using image and design information

High throughput and low cost height triangulation system and method

Inspection recipe generation and inspection based on an inspection...

System and method for inspection

Inspection system and a method for detecting defects based upon a r...

Inspection system and a method for detecting defects based upon a r...

Method and system for inspecting a diced wafer

Method for establishing a wafer testing recipe

Patents Applicationslast 30 patents

SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSP...

AUTOMATIC DEFECT CLASSIFICATION

Migdal Haemeq

HIERARCHICAL WAFER INSPECTION

OBJECTIVE LENS

INSPECTING A WAFER USING IMAGE AND DESIGN INFORMATION

CONTINUOUS LIGHT INSPECTION

HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD

INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION...

METHOD AND A SYSTEM FOR CREATING A REFERENCE IMAGE USING UNKNOWN QU...

SYSTEM AND METHOD FOR INSPECTION

METHOD AND SYSTEM FOR IMAGING AN ELECTRICAL CIRCUIT

INSPECTION SYSTEM AND A METHOD FOR DETECTING DEFECTS BASED UPON A R...

METHOD AND A SYSTEM FOR ESTABLISHING AN INSPECTION-RECIPE

Method and system for inspecting a diced wafer

Inspection System and a Method for Detecting Defects Based Upon a R...