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Kiryat Tivon, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus, system and method of an electrostatically formed nanowir...
Patent number
11,374,120
Issue date
Jun 28, 2022
Tower Semiconductor Ltd.
Zohar Shaked
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus, system and method of a temperature sensor
Patent number
10,788,375
Issue date
Sep 29, 2020
Tower Semiconductor Ltd.
Yakov Roizin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus, system and method of an electrostatically formed nanowir...
Patent number
10,770,573
Issue date
Sep 8, 2020
Tower Semiconductor Ltd.
Zohar Shaked
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor gas sensor using magnetic tunnel junction elements
Patent number
9,885,697
Issue date
Feb 6, 2018
Tower Semiconductor Ltd.
Yakov Roizin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas sensing using magnetic tunnel junction elements
Patent number
9,835,589
Issue date
Dec 5, 2017
Tower Semiconductor Ltd.
Yakov Roizin
G01 - MEASURING TESTING
Information
Patent Grant
Protection against in-process charging in silicon-oxide-nitride-oxi...
Patent number
7,439,575
Issue date
Oct 21, 2008
Tower Semiconductor Ltd.
Yakov Roizin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of decreasing charging effects in oxide-nitride-oxide (ONO)...
Patent number
7,060,627
Issue date
Jun 13, 2006
Tower Semiconductor Ltd.
Micha Gutman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Protection against in-process charging in silicon-oxide-nitride-oxi...
Patent number
6,959,920
Issue date
Nov 1, 2005
Tower Semiconductor Ltd.
Yakov Roizin
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS, SYSTEM AND METHOD OF AN ELECTROSTATICALLY FORMED NANOWIR...
Publication number
20200273972
Publication date
Aug 27, 2020
Tower Semiconductor Ltd.
Zohar Shaked
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS, SYSTEM AND METHOD OF AN ELECTROSTATICALLY FORMED NANOWIR...
Publication number
20200098906
Publication date
Mar 26, 2020
Tower Semiconductor Ltd.
Zohar Shaked
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS, SYSTEM AND METHOD OF A TEMPERATURE SENSOR
Publication number
20190178725
Publication date
Jun 13, 2019
Tower Semiconductor Ltd.
Yakov Roizin
G01 - MEASURING TESTING
Information
Patent Application
Gas Sensing Using Magnetic Tunnel Junction Elements
Publication number
20170160235
Publication date
Jun 8, 2017
Tower Semiconductor Ltd.
Yakov Roizin
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Gas Sensor Using Magnetic Tunnel Junction Elements
Publication number
20170160248
Publication date
Jun 8, 2017
Tower Semiconductor Ltd.
Yakov Roizin
G01 - MEASURING TESTING
Information
Patent Application
Protection againts in-process charging in silicon-oxide-nitride-oxi...
Publication number
20050139903
Publication date
Jun 30, 2005
Tower Semiconductor Ltd.
Yakov Roizin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of decreasing charging effects in oxide-nitride-oxide (ONO)...
Publication number
20050054161
Publication date
Mar 10, 2005
Tower Semiconductor Ltd.
Micha Gutman
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Protection against in-process charging in silicon-oxide-nitride-oxi...
Publication number
20050051838
Publication date
Mar 10, 2005
Tower Semiconductor Ltd.
Yakov Roizin
H01 - BASIC ELECTRIC ELEMENTS