Meng Cao

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Union City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Automatic selection of sample values for optical metrology
- Patent number 10,895,810
- Issue date Jan 19, 2021
- KLA Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement library optimization in semiconductor metrology
- Patent number 10,732,520
- Issue date Aug 4, 2020
- KLA-Tencor Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automated metrology system selection
- Patent number 10,502,692
- Issue date Dec 10, 2019
- KLA-Tencor Corporation
- Meng Cao
- G01 - MEASURING TESTING
Information Patent Grant
Measurement library optimization in semiconductor metrology
- Patent number 10,345,721
- Issue date Jul 9, 2019
- KLA-Tencor Corporation
- Meng Cao
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology system, method, and computer program product employing au...
- Patent number 10,190,868
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Liequan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-model metrology
- Patent number 9,412,673
- Issue date Aug 9, 2016
- KLA-Tencor Corporation
- In-Kyo Kim
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Automated Metrology System Selection
- Publication number 20170023491
- Publication date Jan 26, 2017
- KLA-Tencor Corporation
- Meng Cao
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM, METHOD, AND COMPUTER PROGRAM PRODUCT EMPLOYING AU...
- Publication number 20160320315
- Publication date Nov 3, 2016
- KLA-Tencor Corporation
- Liequan Lee
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODEL METROLOGY
- Publication number 20160322267
- Publication date Nov 3, 2016
- KLA-Tencor Corporation
- In-Kyo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC SELECTION OF SAMPLE VALUES FOR OPTICAL METROLOGY
- Publication number 20150142395
- Publication date May 21, 2015
- Meng Cao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-MODEL METROLOGY
- Publication number 20150058813
- Publication date Feb 26, 2015
- KLA-Tencor Corporation
- In-Kyo Kim
- G06 - COMPUTING CALCULATING COUNTING