Meng-Che Wu

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Detecting defects on a wafer using defect-specific information
- Patent number 9,721,337
- Issue date Aug 1, 2017
- KLA-Tencor Corp.
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting defects on a wafer using defect-specific information
- Patent number 9,189,844
- Issue date Nov 17, 2015
- KLA-Tencor Corp.
- Kenong Wu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific Information
- Publication number 20160071256
- Publication date Mar 10, 2016
- KLA-Tencor Corporation
- Kenong Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Detecting Defects on a Wafer Using Defect-Specific Information
- Publication number 20140105482
- Publication date Apr 17, 2014
- KLA-Tencor Corporation
- Kenong Wu
- G01 - MEASURING TESTING