MENG-FENG TSAI

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Methods for determining focus spot window and judging whether wafer...
- Patent number 11,988,612
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Meng-Hsuan Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 11,961,774
- Issue date Apr 16, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chen Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD, DEVICE AND SYSTEM FOR MONITORING FLATNESS OF WAFER TABLE, A...
- Publication number 20220341732
- Publication date Oct 27, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- MENG-HSUAN TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETERMINING FOCUS SPOT WINDOW AND JUDGING WHETHER WAFER...
- Publication number 20220236196
- Publication date Jul 28, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- MENG-HSUAN TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER DEFECT ANALYSIS METHOD AND SYSTEM, DEVICE AND MEDIUM
- Publication number 20220139744
- Publication date May 5, 2022
- Changxin Memory Technologies, Inc.
- MENG-HSUAN TSAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20220077008
- Publication date Mar 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Chen HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE
- Publication number 20220077009
- Publication date Mar 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Chen HUANG
- H01 - BASIC ELECTRIC ELEMENTS