Meng-Fu Shih

Person

Hsin-Chu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Package structure and method for fabricating the same
- Patent number 12,191,262
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic memory device
- Patent number 12,040,036
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Hsiang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic memory device
- Patent number 11,837,312
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Hsiang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,755,410
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Package structure and method for fabricating the same
- Patent number 11,749,617
- Issue date Sep 5, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic layer characterization system and method
- Patent number 11,726,062
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chia-Hsiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random-access memory (MRAM) random number generato...
- Patent number 11,726,747
- Issue date Aug 15, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,719,742
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive random-access memory (MRAM) random number generato...
- Patent number 11,531,524
- Issue date Dec 20, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Conductive external connector structure and method of forming
- Patent number 11,527,504
- Issue date Dec 13, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,506,706
- Issue date Nov 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,429,482
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Package structure and method for fabricating the same
- Patent number 11,380,626
- Issue date Jul 5, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices and methods having magnetic shielding layer
- Patent number 11,276,649
- Issue date Mar 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and testing method using the same
- Patent number 11,249,131
- Issue date Feb 15, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 10,936,413
- Issue date Mar 2, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 10,877,089
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Package structure and method for fabricating the same
- Patent number 10,818,609
- Issue date Oct 27, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Harry-Hak-Lay Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive external connector structure and method of forming
- Patent number 10,741,513
- Issue date Aug 11, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method for testing MRAM device and test apparatus thereof
- Patent number 10,665,321
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Yu Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for correcting data errors in memory susceptibl...
- Patent number 10,228,998
- Issue date Mar 12, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 10,176,998
- Issue date Jan 8, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chun-Yu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive external connector structure and method of forming
- Patent number 10,163,836
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Non-volatile memory device and structure thereof
- Patent number 10,128,313
- Issue date Nov 13, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chi-Tsai Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming semiconductor device structure with bumps
- Patent number 10,014,218
- Issue date Jul 3, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Meng-Fu Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive external connector structure and method of forming
- Patent number 9,875,979
- Issue date Jan 23, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHODS FOR CLEANING A PACKAGE
- Publication number 20240395571
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ying-Hao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Magnetic Memory Device
- Publication number 20240331796
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Hsiang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETIC MEMORY DEVICE
- Publication number 20230410932
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Hsiang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic Memory Device
- Publication number 20230410931
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Hsiang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus and Methods for Cleaning a Package
- Publication number 20230377910
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ying-Hao Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230361050
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20230333157
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...
- Publication number 20230115281
- Publication date Apr 13, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20220373594
- Publication date Nov 24, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20220358013
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20220328423
- Publication date Oct 13, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC LAYER CHARACTERIZATION SYSTEM AND METHOD
- Publication number 20220299474
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Hsiang Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST APPARATUS AND TESTING METHOD USING THE SAME
- Publication number 20210311105
- Publication date Oct 7, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Correcting Data Errors in Memory
- Publication number 20210173739
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20210109152
- Publication date Apr 15, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20210043582
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND METHODS HAVING MAGNETIC SHIELDING LAYER
- Publication number 20200411449
- Publication date Dec 31, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Harry-Hak-Lay Chuang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Conductive External Connector Structure and Method of Forming
- Publication number 20200373267
- Publication date Nov 26, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Meng-Fu Shih
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...
- Publication number 20200097255
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20200096559
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME
- Publication number 20200020642
- Publication date Jan 16, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- HARRY-HAK-LAY CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CORRECTING DATA ERRORS IN MEMORY
- Publication number 20190205208
- Publication date Jul 4, 2019
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Conductive External Connector Structure and Method of Forming
- Publication number 20190131263
- Publication date May 2, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
METHOD FOR TESTING MRAM DEVICE AND TEST APPARATUS THEREOF
- Publication number 20190066820
- Publication date Feb 28, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Yu Wang
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180308700
- Publication date Oct 25, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chun-Yu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Conductive External Connector Structure and Method of Forming
- Publication number 20180166409
- Publication date Jun 14, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
SYSTEMS AND METHODS FOR CORRECTING DATA ERRORS IN MEMORY
- Publication number 20180039537
- Publication date Feb 8, 2018
- Taiwan Semiconductor Manufacturing Company Limited
- YU-DER CHIH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NON-VOLATILE MEMORY DEVICE AND STRUCTURE THEREOF
- Publication number 20170229515
- Publication date Aug 10, 2017
- Taiwan Semiconductor Manufacturing company Ltd.
- CHI-TSAI CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
Conductive External Connector Structure and Method of Forming
- Publication number 20170141059
- Publication date May 18, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Meng-Fu Shih
- H01 - BASIC ELECTRIC ELEMENTS

Meng-Fu Shih

Person

Patents Grantslast 30 patents

Package structure and method for fabricating the same

Magnetic memory device

Magnetic memory device

Systems and methods for correcting data errors in memory

Package structure and method for fabricating the same

Magnetic layer characterization system and method

Magnetoresistive random-access memory (MRAM) random number generato...

Semiconductor wafer testing system and related method for improving...

Magnetoresistive random-access memory (MRAM) random number generato...

Conductive external connector structure and method of forming

Semiconductor wafer testing system and related method for improving...

Systems and methods for correcting data errors in memory

Package structure and method for fabricating the same

Devices and methods having magnetic shielding layer

Test apparatus and testing method using the same

Systems and methods for correcting data errors in memory

Semiconductor wafer testing system and related method for improving...

Package structure and method for fabricating the same

Conductive external connector structure and method of forming

Method for testing MRAM device and test apparatus thereof

Systems and methods for correcting data errors in memory susceptibl...

Semiconductor device

Conductive external connector structure and method of forming

Non-volatile memory device and structure thereof

Method for forming semiconductor device structure with bumps

Conductive external connector structure and method of forming

Patents Applicationslast 30 patents

APPARATUS AND METHODS FOR CLEANING A PACKAGE

Magnetic Memory Device

MAGNETIC MEMORY DEVICE

Magnetic Memory Device

Apparatus and Methods for Cleaning a Package

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

Systems and Methods for Correcting Data Errors in Memory

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

MAGNETIC LAYER CHARACTERIZATION SYSTEM AND METHOD

TEST APPARATUS AND TESTING METHOD USING THE SAME

Systems and Methods for Correcting Data Errors in Memory

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

DEVICES AND METHODS HAVING MAGNETIC SHIELDING LAYER

Conductive External Connector Structure and Method of Forming

MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) RANDOM NUMBER GENERATO...

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAME

SYSTEMS AND METHODS FOR CORRECTING DATA ERRORS IN MEMORY

Conductive External Connector Structure and Method of Forming

METHOD FOR TESTING MRAM DEVICE AND TEST APPARATUS THEREOF

SEMICONDUCTOR DEVICE

Conductive External Connector Structure and Method of Forming

SYSTEMS AND METHODS FOR CORRECTING DATA ERRORS IN MEMORY

NON-VOLATILE MEMORY DEVICE AND STRUCTURE THEREOF

Conductive External Connector Structure and Method of Forming