Meng Yew SEAH

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Probe card integrated with a hall sensor
- Patent number 11,761,983
- Issue date Sep 19, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Guoquan Teo
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe card integrated with a light source facing a device und...
- Patent number 10,859,625
- Issue date Dec 8, 2020
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Lanxiang Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD INTEGRATED WITH A HALL SENSOR
- Publication number 20230083401
- Publication date Mar 16, 2023
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Guoquan TEO
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE CARD INTEGRATED WITH A LIGHT SOURCE FACING A DEVICE UND...
- Publication number 20200064397
- Publication date Feb 27, 2020
- GLOBALFOUNDRIES SINGAPORE PTE. LTD.
- Lanxiang WANG
- G01 - MEASURING TESTING