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Mengmeng Ye
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Shanghai, CN
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Patents Grants
last 30 patents
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Patent Grant
Multi-environment polarized infrared reflectometer for semiconducto...
Patent number
11,231,362
Issue date
Jan 25, 2022
KLA Corporation
Guorong V. Zhuang
G01 - MEASURING TESTING
Information
Patent Grant
Recipe optimization based zonal analysis
Patent number
10,763,146
Issue date
Sep 1, 2020
KLA-Tencor Corporation
Roie Volkovich
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement library optimization in semiconductor metrology
Patent number
10,732,520
Issue date
Aug 4, 2020
KLA-Tencor Corporation
Meng Cao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Automated metrology system selection
Patent number
10,502,692
Issue date
Dec 10, 2019
KLA-Tencor Corporation
Meng Cao
G01 - MEASURING TESTING
Information
Patent Grant
Measurement library optimization in semiconductor metrology
Patent number
10,345,721
Issue date
Jul 9, 2019
KLA-Tencor Corporation
Meng Cao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Recipe Optimization Based Zonal Analysis
Publication number
20190088514
Publication date
Mar 21, 2019
KLA-Tencor Corporation
Roie VOLKOVICH
G01 - MEASURING TESTING
Information
Patent Application
Automated Metrology System Selection
Publication number
20170023491
Publication date
Jan 26, 2017
KLA-Tencor Corporation
Meng Cao
G01 - MEASURING TESTING