Mervyn Y. Tan

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
IC layout optimization to improve yield
- Patent number 7,818,694
- Issue date Oct 19, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus, and computer program product for displaying and...
- Patent number 7,752,589
- Issue date Jul 6, 2010
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for global circuit routing incorporating estimati...
- Patent number 7,685,553
- Issue date Mar 23, 2010
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for net-aware critical area extraction
- Patent number 7,661,080
- Issue date Feb 9, 2010
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for computing the critical area of compound fault mechanisms
- Patent number 7,634,745
- Issue date Dec 15, 2009
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC layout optimization to improve yield
- Patent number 7,503,020
- Issue date Mar 10, 2009
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample probability of fault function determination using critical d...
- Patent number 7,310,788
- Issue date Dec 18, 2007
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probability of fault function determination using critical defect s...
- Patent number 7,302,653
- Issue date Nov 27, 2007
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit layout critical area determination using Voronoi...
- Patent number 7,240,306
- Issue date Jul 3, 2007
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IC Layout Optimization to Improve Yield
- Publication number 20090100386
- Publication date Apr 16, 2009
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GLOBAL CIRCUIT ROUTING INCORPORATING ESTIMATI...
- Publication number 20080256502
- Publication date Oct 16, 2008
- International Business Machines Corporation
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR NET-AWARE CRITICAL AREA EXTRACTION
- Publication number 20080178137
- Publication date Jul 24, 2008
- Evanthia Papadopoulou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DISPLAYING AND...
- Publication number 20080168414
- Publication date Jul 10, 2008
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR COMPUTING THE CRITICAL AREA OF COMPOUND FAULT MECHANISMS
- Publication number 20080127004
- Publication date May 29, 2008
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IC Layout Optimization To Improve Yield
- Publication number 20070294648
- Publication date Dec 20, 2007
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRITICAL AREA COMPUTATION OF COMPOSITE FAULT MECHANISMS USING VORON...
- Publication number 20070256040
- Publication date Nov 1, 2007
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE PROBABILITY OF FAULT FUNCTION DETERMINATION USING CRITICAL D...
- Publication number 20060190223
- Publication date Aug 24, 2006
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBABILITY OF FAULT FUNCTION DETERMINATION USING CRITICAL DEFECT S...
- Publication number 20060190222
- Publication date Aug 24, 2006
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT LAYOUT CRITICAL AREA DETERMINATION USING VORONOI...
- Publication number 20060190224
- Publication date Aug 24, 2006
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT YIELD ENHANCEMENT USING VORONOI DIAGRAMS
- Publication number 20060150130
- Publication date Jul 6, 2006
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRITICAL AREA COMPUTATION OF COMPOSITE FAULT MECHANISMS USING VORON...
- Publication number 20050240839
- Publication date Oct 27, 2005
- International Business Machines Corporation
- Robert J. Allen
- G06 - COMPUTING CALCULATING COUNTING

Mervyn Y. Tan

Person

Patents Grantslast 30 patents

IC layout optimization to improve yield

Method, apparatus, and computer program product for displaying and...

System and method for global circuit routing incorporating estimati...

Method and apparatus for net-aware critical area extraction

Method for computing the critical area of compound fault mechanisms

IC layout optimization to improve yield

Sample probability of fault function determination using critical d...

Probability of fault function determination using critical defect s...

Integrated circuit layout critical area determination using Voronoi...

Patents Applicationslast 30 patents

IC Layout Optimization to Improve Yield

SYSTEM AND METHOD FOR GLOBAL CIRCUIT ROUTING INCORPORATING ESTIMATI...

METHOD AND APPARATUS FOR NET-AWARE CRITICAL AREA EXTRACTION

METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR DISPLAYING AND...

METHOD FOR COMPUTING THE CRITICAL AREA OF COMPOUND FAULT MECHANISMS

IC Layout Optimization To Improve Yield

CRITICAL AREA COMPUTATION OF COMPOSITE FAULT MECHANISMS USING VORON...

SAMPLE PROBABILITY OF FAULT FUNCTION DETERMINATION USING CRITICAL D...

PROBABILITY OF FAULT FUNCTION DETERMINATION USING CRITICAL DEFECT S...

INTEGRATED CIRCUIT LAYOUT CRITICAL AREA DETERMINATION USING VORONOI...

INTEGRATED CIRCUIT YIELD ENHANCEMENT USING VORONOI DIAGRAMS

CRITICAL AREA COMPUTATION OF COMPOSITE FAULT MECHANISMS USING VORON...