Michael A. Casolo

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Oakland, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dual channel source measurement unit for semiconductor device testing
- Patent number 7,151,389
- Issue date Dec 19, 2006
- QualiTau, Inc.
- Tal Raichman
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card and air cooled probe head system
- Patent number 7,126,361
- Issue date Oct 24, 2006
- QualiTau, Inc.
- Michael L. Anderson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dual channel source measurement unit for semiconductor device testing
- Publication number 20050194963
- Publication date Sep 8, 2005
- QualiTau, Inc.
- Tal Raichman
- G01 - MEASURING TESTING