Michael A. Cookson

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor fabrication facility visualization system with perfor...
- Patent number 8,229,587
- Issue date Jul 24, 2012
- Muratec Automation Co., Ltd.
- Karl Shieh
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for in-cassette wafer center determination
- Patent number 6,298,280
- Issue date Oct 2, 2001
- Asyst Technologies, Inc.
- Anthony C. Bonora
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
VAO Productivity Suite
- Publication number 20100023151
- Publication date Jan 28, 2010
- ASYST TECHNOLOGIES, INC.
- Karl Shieh
- G05 - CONTROLLING REGULATING