Michael A. Kelly

Person

Portola Valley, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical source in microwave impedance microscopy
- Patent number 10,473,694
- Issue date Nov 12, 2019
- Primenano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Grant
Optically excited microwave impedance microscopy
- Patent number 10,274,513
- Issue date Apr 30, 2019
- Primenano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Grant
Synthesis of higher diamondoids
- Patent number 8,367,166
- Issue date Feb 5, 2013
- Chevron U.S.A. Inc.
- Jeremy E. Dahl
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Modulated microwave microscopy and probes used therewith
- Patent number 8,266,718
- Issue date Sep 11, 2012
- The Board of Trustees of Leland Stanford Junior University
- Keji Lai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coaxial charged particle energy analyzer
- Patent number 7,928,381
- Issue date Apr 19, 2011
- Apparati, Inc.
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal microwave imaging probe
- Patent number 7,190,175
- Issue date Mar 13, 2007
- Stanford University
- Michael Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Non-dispersive charged particle energy analyzer
- Patent number 7,141,800
- Issue date Nov 28, 2006
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-resonant microwave imaging probe
- Patent number 6,825,645
- Issue date Nov 30, 2004
- Stanford University Office of Technology Licensing
- Michael A. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Electron analyzer having an integrated low pass filter
- Patent number 6,501,076
- Issue date Dec 31, 2002
- FEI Company
- Michael A. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Control of surface potential of insulating specimens in surface ana...
- Patent number 5,990,476
- Issue date Nov 23, 1999
- Physical Electronics Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Electron analyzer with integrated optics
- Patent number 5,969,354
- Issue date Oct 19, 1999
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput electron energy analyzer
- Patent number 5,583,336
- Issue date Dec 10, 1996
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual electron analyzer
- Patent number 5,466,933
- Issue date Nov 14, 1995
- Surface Interface, Inc.
- Charles E. Bryson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for control of surface potential
- Patent number 5,432,345
- Issue date Jul 11, 1995
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical vapor deposition under a single reactor vessel divided int...
- Patent number 5,366,555
- Issue date Nov 22, 1994
- Michael A. Kelly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for chemical vapor deposition under a single reactor vessel...
- Patent number 5,071,670
- Issue date Dec 10, 1991
- Michael A. Kelly
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electric electron energy analyzer
- Patent number 4,764,673
- Issue date Aug 16, 1988
- Kevex Corporation
- Charles E. Bryson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzer based upon isentropic containment
- Patent number 4,710,625
- Issue date Dec 1, 1987
- Kevex Corporation
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic lens to rotate transverse particle momenta
- Patent number 4,554,457
- Issue date Nov 19, 1985
- Surface Science Laboratories, Inc.
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Optical source in microwave impedance microscopy
- Publication number 20190234993
- Publication date Aug 1, 2019
- PrimeNano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Application
Optically excited microwave impedance microscopy
- Publication number 20180217181
- Publication date Aug 2, 2018
- PrimeNano, Inc.
- Stuart L. Friedman
- G01 - MEASURING TESTING
Information Patent Application
Applicable Fluorescence of Diamondoids
- Publication number 20110308605
- Publication date Dec 22, 2011
- Justus-Liebig-Universitaet Giessen
- Zhi Liu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Molecular Rectifiers Comprising Diamondoids
- Publication number 20110082053
- Publication date Apr 7, 2011
- Wanli Yang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Modulated microwave microscopy and probes used therewith
- Publication number 20100218286
- Publication date Aug 26, 2010
- The Board of Trustees of the Leland Stanford Junior University
- Keji Lai
- G01 - MEASURING TESTING
Information Patent Application
Synthesis of Higher Diamondoids
- Publication number 20100112214
- Publication date May 6, 2010
- Chevron U.S.A. Inc.
- Jeremy E. Dahl
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Non-dispersive charged particle energy analyzer
- Publication number 20050045832
- Publication date Mar 3, 2005
- Michael A. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Non-resonant microwave imaging probe
- Publication number 20030071605
- Publication date Apr 17, 2003
- Michael A. Kelly
- G01 - MEASURING TESTING

Michael A. Kelly

Person

Patents Grantslast 30 patents

Optical source in microwave impedance microscopy

Optically excited microwave impedance microscopy

Synthesis of higher diamondoids

Modulated microwave microscopy and probes used therewith

Coaxial charged particle energy analyzer

Orthogonal microwave imaging probe

Non-dispersive charged particle energy analyzer

Non-resonant microwave imaging probe

Electron analyzer having an integrated low pass filter

Control of surface potential of insulating specimens in surface ana...

Electron analyzer with integrated optics

High throughput electron energy analyzer

Dual electron analyzer

Method and apparatus for control of surface potential

Chemical vapor deposition under a single reactor vessel divided int...

Method for chemical vapor deposition under a single reactor vessel...

Electric electron energy analyzer

Charged particle energy analyzer based upon isentropic containment

Magnetic lens to rotate transverse particle momenta

Patents Applicationslast 30 patents

Optical source in microwave impedance microscopy

Optically excited microwave impedance microscopy

Applicable Fluorescence of Diamondoids

Molecular Rectifiers Comprising Diamondoids

Modulated microwave microscopy and probes used therewith

Synthesis of Higher Diamondoids

Non-dispersive charged particle energy analyzer

Non-resonant microwave imaging probe