Michael A. Lamson

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Van Alstyne, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Coaxial four-point probe for low resistance measurements
- Patent number 9,030,216
- Issue date May 12, 2015
- Texas Instruments Incorporated
- Michael Anthony Lamson
- G01 - MEASURING TESTING
Information Patent Grant
Coaxial four-point probe for low resistance measurements
- Patent number 8,174,276
- Issue date May 8, 2012
- Texas Instruments Incorporated
- Michael Anthony Lamson
- G01 - MEASURING TESTING
Information Patent Grant
FA tool using conductor model
- Patent number 7,132,845
- Issue date Nov 7, 2006
- Texas Instruments Incorporated
- Michael Anthony Lamson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for electrically modeling an electronic structure and method...
- Patent number 6,820,046
- Issue date Nov 16, 2004
- Texas Instruments Incorporated
- Michael A. Lamson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring semiconductor lead inductance by changing the d...
- Patent number 5,160,893
- Issue date Nov 3, 1992
- Texas Instruments Incorporated
- Michael A. Lamson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Coaxial Four-Point Probe for Low Resistance Measurements
- Publication number 20120194208
- Publication date Aug 2, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Michael Anthony Lamson
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL FOUR-POINT PROBE FOR LOW RESISTANCE MEASUREMENTS
- Publication number 20090289648
- Publication date Nov 26, 2009
- Michael Anthony Lamson
- G01 - MEASURING TESTING