Michael A. Stuber

Person

Rancho Santa Fe, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Connection arrangements for integrated lateral diffusion field effe...
- Patent number 12,159,815
- Issue date Dec 3, 2024
- Silanna Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 11,967,948
- Issue date Apr 23, 2024
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
- Patent number 11,901,459
- Issue date Feb 13, 2024
- pSemi Corporation
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 11,362,652
- Issue date Jun 14, 2022
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connection arrangements for integrated lateral diffusion field effe...
- Patent number 11,335,627
- Issue date May 17, 2022
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
- Patent number RE48965
- Issue date Mar 8, 2022
- pSemi Corporation
- Michael A. Stuber
Information Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
- Patent number 11,201,245
- Issue date Dec 14, 2021
- pSemi Corporation
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus improving gate oxide reliability by controllin...
- Patent number 10,818,796
- Issue date Oct 27, 2020
- pSemi Corporation
- Michael A. Stuber
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,797,691
- Issue date Oct 6, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,797,172
- Issue date Oct 6, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,797,690
- Issue date Oct 6, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,790,814
- Issue date Sep 29, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,790,815
- Issue date Sep 29, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,784,855
- Issue date Sep 22, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transistor with gate extension to limit second gate effect
- Patent number 10,770,391
- Issue date Sep 8, 2020
- QUALCOMM Incorporated
- Plamen Vassilev Kolev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,680,600
- Issue date Jun 9, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,630,286
- Issue date Apr 21, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,622,990
- Issue date Apr 14, 2020
- pSemi Corporation
- Christopher N. Brindle
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Connection arrangements for integrated lateral diffusion field effe...
- Patent number 10,546,804
- Issue date Jan 28, 2020
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit connection arrangement for minimizing crosstalk
- Patent number 10,446,687
- Issue date Oct 15, 2019
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical semiconductor device with thinned substrate
- Patent number 10,431,598
- Issue date Oct 1, 2019
- QUALCOMM Incorporated
- Stuart B. Molin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Leadframe and integrated circuit connection arrangement
- Patent number 10,424,666
- Issue date Sep 24, 2019
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power device on bulk substrate
- Patent number 10,290,702
- Issue date May 14, 2019
- Silanna Asia Pte Ltd
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Utilization of backside silicidation to form dual side contacted ca...
- Patent number 10,290,579
- Issue date May 14, 2019
- QUALCOMM Incorporated
- Sinan Goktepeli
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Connection arrangements for integrated lateral diffusion field effe...
- Patent number 10,249,759
- Issue date Apr 2, 2019
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor-on-insulator with back side heat dissipation
- Patent number 10,217,822
- Issue date Feb 26, 2019
- QUALCOMM Incorporated
- Paul A. Nygaard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of making integrated circuit assembly with faraday cage and...
- Patent number 10,211,167
- Issue date Feb 19, 2019
- QUALCOMM Incorporated
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit connection arrangement for minimizing crosstalk
- Patent number 10,192,989
- Issue date Jan 29, 2019
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for use in improving linearity of MOSFETs usin...
- Patent number 10,153,763
- Issue date Dec 11, 2018
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connection arrangements for integrated lateral diffusion field effe...
- Patent number 10,083,897
- Issue date Sep 25, 2018
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20240388285
- Publication date Nov 21, 2024
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...
- Publication number 20240266441
- Publication date Aug 8, 2024
- pSemi Corporation
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20220311432
- Publication date Sep 29, 2022
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...
- Publication number 20220278027
- Publication date Sep 1, 2022
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...
- Publication number 20220181497
- Publication date Jun 9, 2022
- pSemi Corporation
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20210194478
- Publication date Jun 24, 2021
- pSemi Corporation
- Christopher N. Brindle
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...
- Publication number 20200335633
- Publication date Oct 22, 2020
- pSemi Corporation
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20200295751
- Publication date Sep 17, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...
- Publication number 20200144163
- Publication date May 7, 2020
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20200112305
- Publication date Apr 9, 2020
- pSemi Corporation
- Christopher N. Brindle
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20200067504
- Publication date Feb 27, 2020
- pSemi Corporation
- Christopher N. Brindle
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20200036378
- Publication date Jan 30, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...
- Publication number 20200036377
- Publication date Jan 30, 2020
- pSemi Corporation
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL SEMICONDUCTOR DEVICE WITH THINNED SUBSTRATE
- Publication number 20190386026
- Publication date Dec 19, 2019
- QUALCOMM Incorporated
- Stuart B. Molin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR
- Publication number 20190304898
- Publication date Oct 3, 2019
- QUALCOMM Incorporated
- Plamen Vassilev KOLEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for use in Improving Linearity of MOSFETs usin...
- Publication number 20190238126
- Publication date Aug 1, 2019
- pSemi Corporation
- Christopher N. Brindle
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT CONNECTION ARRANGEMENT FOR MINIMIZING CROSSTALK
- Publication number 20190157446
- Publication date May 23, 2019
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for use in Improving Linearity of MOSFETs usin...
- Publication number 20190089348
- Publication date Mar 21, 2019
- pSemi Corporation
- Christopher N. Brindle
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...
- Publication number 20190027428
- Publication date Jan 24, 2019
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...
- Publication number 20180240876
- Publication date Aug 23, 2018
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT CONNECTION ARRANGEMENT FOR MINIMIZING CROSSTALK
- Publication number 20180240904
- Publication date Aug 23, 2018
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...
- Publication number 20180240737
- Publication date Aug 23, 2018
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEADFRAME AND INTEGRATED CIRCUIT CONNECTION ARRANGEMENT
- Publication number 20180240740
- Publication date Aug 23, 2018
- Silanna Asia Pte Ltd
- Shanghui Larry Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for use in Improving Linearity of MOSFETs Usin...
- Publication number 20180083614
- Publication date Mar 22, 2018
- Peregrine Semiconductor Corporatoin
- Christopher N. Brindle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
UTILIZATION OF BACKSIDE SILICIDATION TO FORM DUAL SIDE CONTACTED CA...
- Publication number 20180076137
- Publication date Mar 15, 2018
- QUALCOMM Incorporated
- Sinan GOKTEPELI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VERTICAL SEMICONDUCTOR DEVICE WITH THINNED SUBSTRATE
- Publication number 20170243887
- Publication date Aug 24, 2017
- QUALCOMM Incorporated
- Stuart B. Molin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus Improving Gate Oxide Reliability by Controllin...
- Publication number 20170236946
- Publication date Aug 17, 2017
- PEREGRINE SEMICONDUCTOR CORPORATION
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER DEVICE ON BULK SUBSTRATE
- Publication number 20170229536
- Publication date Aug 10, 2017
- Silanna Asia Pte Ltd
- Michael A. Stuber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Forming Semiconductor Structure with Device Layers and TRL
- Publication number 20170101309
- Publication date Apr 13, 2017
- QUALCOMM Incorporated
- Michael A. Stuber
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Semiconductor-On-Insulator With Back Side Heat Disspation
- Publication number 20160359002
- Publication date Dec 8, 2016
- QUALCOMM Incorporated
- Paul A. Nygaard
- H01 - BASIC ELECTRIC ELEMENTS

Michael A. Stuber

Person

Patents Grantslast 30 patents

Connection arrangements for integrated lateral diffusion field effe...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus improving gate oxide reliability by controllin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Connection arrangements for integrated lateral diffusion field effe...

Method and apparatus improving gate oxide reliability by controllin...

Method and apparatus improving gate oxide reliability by controllin...

Method and apparatus improving gate oxide reliability by controllin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Transistor with gate extension to limit second gate effect

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Method and apparatus for use in improving linearity of MOSFETs usin...

Connection arrangements for integrated lateral diffusion field effe...

Integrated circuit connection arrangement for minimizing crosstalk

Vertical semiconductor device with thinned substrate

Leadframe and integrated circuit connection arrangement

Power device on bulk substrate

Utilization of backside silicidation to form dual side contacted ca...

Connection arrangements for integrated lateral diffusion field effe...

Semiconductor-on-insulator with back side heat dissipation

Methods of making integrated circuit assembly with faraday cage and...

Integrated circuit connection arrangement for minimizing crosstalk

Method and apparatus for use in improving linearity of MOSFETs usin...

Connection arrangements for integrated lateral diffusion field effe...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...

METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

METHOD AND APPARATUS IMPROVING GATE OXIDE RELIABILITY BY CONTROLLIN...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USIN...

VERTICAL SEMICONDUCTOR DEVICE WITH THINNED SUBSTRATE

TRANSISTOR

Method and Apparatus for use in Improving Linearity of MOSFETs usin...

INTEGRATED CIRCUIT CONNECTION ARRANGEMENT FOR MINIMIZING CROSSTALK

Method and Apparatus for use in Improving Linearity of MOSFETs usin...

CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...

CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...

INTEGRATED CIRCUIT CONNECTION ARRANGEMENT FOR MINIMIZING CROSSTALK

CONNECTION ARRANGEMENTS FOR INTEGRATED LATERAL DIFFUSION FIELD EFFE...

LEADFRAME AND INTEGRATED CIRCUIT CONNECTION ARRANGEMENT

Method and Apparatus for use in Improving Linearity of MOSFETs Usin...

UTILIZATION OF BACKSIDE SILICIDATION TO FORM DUAL SIDE CONTACTED CA...

VERTICAL SEMICONDUCTOR DEVICE WITH THINNED SUBSTRATE

Method and Apparatus Improving Gate Oxide Reliability by Controllin...

POWER DEVICE ON BULK SUBSTRATE

Forming Semiconductor Structure with Device Layers and TRL

Semiconductor-On-Insulator With Back Side Heat Disspation