Michael A. Ziegerhofer

Person

Jeffersonville, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 11,295,829
- Issue date Apr 5, 2022
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for soft-error protection in operation of ECC an...
- Patent number 11,288,120
- Issue date Mar 29, 2022
- MARVELL ASIA PTE. LTD.
- Michael A. Ziegerhofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,971,243
- Issue date Apr 6, 2021
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory built-in self test error correcting code (MBIST ECC) for low...
- Patent number 10,950,325
- Issue date Mar 16, 2021
- Marvell Asia Pte., Ltd.
- Deepak I. Hanagandi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Zero test time memory using background built-in self-test
- Patent number 10,839,931
- Issue date Nov 17, 2020
- Marvell Asia Pte, Ltd.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,692,584
- Issue date Jun 23, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test (BIST) engine configured to store a per pattern...
- Patent number 10,553,302
- Issue date Feb 4, 2020
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory built-in self-test (MBIST) test time reduction
- Patent number 10,490,296
- Issue date Nov 26, 2019
- GLOBALFOUNDRIES U.S. INC.
- Michael R. Ouellette
- G11 - INFORMATION STORAGE
Information Patent Grant
Zero test time memory using background built-in self-test
- Patent number 10,438,678
- Issue date Oct 8, 2019
- GLOBALFOUNDRIES Inc.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in-self-test (BIST) engine configured to store a per pattern...
- Patent number 9,881,694
- Issue date Jan 30, 2018
- International Business Machines Corporation
- Aravindan J. Busi
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable counter to control memory built in self-test
- Patent number 9,859,019
- Issue date Jan 2, 2018
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for capturing results of memory testing
- Patent number 9,286,181
- Issue date Mar 15, 2016
- GLOBALFOUNDRIES Inc.
- Craig M. Monroe
- G11 - INFORMATION STORAGE
Information Patent Grant
Staggered start of BIST controllers and BIST engines
- Patent number 8,935,586
- Issue date Jan 13, 2015
- International Business Machines Corporation
- Valarie H. Chickanosky
- G01 - MEASURING TESTING
Information Patent Grant
Decreasing power supply demand during BIST initializations
- Patent number 8,918,690
- Issue date Dec 23, 2014
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Grant
Interleaving of memory repair data compression and fuse programming...
- Patent number 8,719,648
- Issue date May 6, 2014
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Validating interconnections between logic blocks in a circuit descr...
- Patent number 8,595,678
- Issue date Nov 26, 2013
- International Business Machines Corporation
- Craig M. Monroe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Selectable repair pass masking
- Patent number 8,570,820
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Kevin William Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Determining fusebay storage element usage
- Patent number 8,537,627
- Issue date Sep 17, 2013
- International Business Machines Corporation
- Michael R. Ouellette
- G11 - INFORMATION STORAGE
Information Patent Grant
Fusebay controller structure, system, and method
- Patent number 8,484,543
- Issue date Jul 9, 2013
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Structure and method for storing multiple repair pass data into a f...
- Patent number 8,467,260
- Issue date Jun 18, 2013
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit structure and method for digital integrated circuit perform...
- Patent number 8,214,699
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure for increasing fuse programming yield
- Patent number 7,895,028
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Darren Lane Anand
- G11 - INFORMATION STORAGE
Information Patent Grant
Device threshold calibration through state dependent burn-in
- Patent number 7,826,288
- Issue date Nov 2, 2010
- International Business Machines Corporation
- Igor Arsovski
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatically extensible addressing for shared array built-in self-...
- Patent number 7,757,141
- Issue date Jul 13, 2010
- International Business Machines Corporation
- Valerie H. Chickanosky
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for increasing fuse programming yield through...
- Patent number 7,251,756
- Issue date Jul 31, 2007
- International Business Machines Corporation
- Darren Lane Anand
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT AND METHOD FOR SOFT-ERROR PROTECTION IN OPERATION OF ECC AN...
- Publication number 20210286672
- Publication date Sep 16, 2021
- Marvell Semiconductor, Inc.
- Michael A. Ziegerhofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY BUILT-IN SELF TEST ERROR CORRECTING CODE (MBIST ECC) FOR LOW...
- Publication number 20200321070
- Publication date Oct 8, 2020
- Marvell International Ltd.
- Deepak I. HANAGANDI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20200075119
- Publication date Mar 5, 2020
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20190378587
- Publication date Dec 12, 2019
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST
- Publication number 20190348137
- Publication date Nov 14, 2019
- GLOBALFOUNDRIES INC.
- Igor ARSOVSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST
- Publication number 20180286491
- Publication date Oct 4, 2018
- GLOBALFOUNDRIES INC.
- Igor ARSOVSKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180061509
- Publication date Mar 1, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...
- Publication number 20180053566
- Publication date Feb 22, 2018
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY BUILT-IN SELF-TEST (MBIST) TEST TIME REDUCTION
- Publication number 20170229191
- Publication date Aug 10, 2017
- GLOBALFOUNDRIES INC.
- Michael R. Ouellette
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF-TEST (BIST) ENGINE
- Publication number 20170018313
- Publication date Jan 19, 2017
- International Business Machines Corporation
- Aravindan J. BUSI
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS FOR CAPTURING RESULTS OF MEMORY TESTING
- Publication number 20150039950
- Publication date Feb 5, 2015
- International Business Machines Corporation
- Craig M. Monroe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DECREASING POWER SUPPLY DEMAND DURING BIST INITIALIZATIONS
- Publication number 20140189448
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Deepak I. Hanagandi
- G11 - INFORMATION STORAGE
Information Patent Application
STAGGERED START OF BIST CONTROLLERS AND BIST ENGINES
- Publication number 20140129888
- Publication date May 8, 2014
- International Business Machines Corporation
- Valerie H. Chickanosky
- G01 - MEASURING TESTING
Information Patent Application
VALIDATING INTERCONNECTIONS BETWEEN LOGIC BLOCKS IN A CIRCUIT DESCR...
- Publication number 20130205268
- Publication date Aug 8, 2013
- International Business Machines Corporation
- Craig M. Monroe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINING FUSEBAY STORAGE ELEMENT USAGE
- Publication number 20130058176
- Publication date Mar 7, 2013
- International Business Machines Corporation
- Michael R. Ouellette
- G11 - INFORMATION STORAGE
Information Patent Application
FUSEBAY CONTROLLER STRUCTURE, SYSTEM, AND METHOD
- Publication number 20130042166
- Publication date Feb 14, 2013
- International Business Machines Corporation
- Darren L. Anand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE AND METHOD FOR STORING MULTIPLE REPAIR PASS DATA INTO A F...
- Publication number 20130033951
- Publication date Feb 7, 2013
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
INTERLEAVING OF MEMORY REPAIR DATA COMPRESSION AND FUSE PROGRAMMING...
- Publication number 20130031319
- Publication date Jan 31, 2013
- International Business Machines Corporation
- Kevin W. Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
SELECTABLE REPAIR PASS MASKING
- Publication number 20120230136
- Publication date Sep 13, 2012
- International Business Machines Corporation
- Kevin William Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD, APPARATUS, AND DESIGN STRUCTURE FOR BUILT-IN SELF-TEST
- Publication number 20110029827
- Publication date Feb 3, 2011
- International Business Machines Corporation
- VALERIE H CHICKANOSKY
- G11 - INFORMATION STORAGE
Information Patent Application
CIRCUIT STRUCTURE AND METHOD FOR DIGITAL INTEGRATED CIRCUIT PERFORM...
- Publication number 20090327620
- Publication date Dec 31, 2009
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATICALLY EXTENSIBLE ADDRESSING FOR SHARED ARRAY BUILT-IN SELF-...
- Publication number 20090249146
- Publication date Oct 1, 2009
- International Business Machines Corporation
- Valerie H. CHICKANOSKY
- G01 - MEASURING TESTING
Information Patent Application
Device Threshold Calibration Through State Dependent Burnin
- Publication number 20090099828
- Publication date Apr 16, 2009
- Igor Arsovski
- G11 - INFORMATION STORAGE
Information Patent Application
DESIGN STRUCTURE FOR INCREASING FUSE PROGRAMMING YIELD
- Publication number 20090016129
- Publication date Jan 15, 2009
- Darren Anand
- G11 - INFORMATION STORAGE
Information Patent Application
DEVICE THRESHOLD CALIBRATION THROUGH STATE DEPENDENT BURNIN
- Publication number 20080219069
- Publication date Sep 11, 2008
- Igor Arsovski
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR INCREASING FUSE PROGRAMMING YIELD THROUGH...
- Publication number 20060239088
- Publication date Oct 26, 2006
- International Business Machines Corporation
- Darren Lane Anand
- G11 - INFORMATION STORAGE

Michael A. Ziegerhofer

Person

Patents Grantslast 30 patents

Built-in self-test (BIST) engine configured to store a per pattern...

Circuit and method for soft-error protection in operation of ECC an...

Built-in self-test (BIST) engine configured to store a per pattern...

Memory built-in self test error correcting code (MBIST ECC) for low...

Zero test time memory using background built-in self-test

Built-in self-test (BIST) engine configured to store a per pattern...

Built-in self-test (BIST) engine configured to store a per pattern...

Memory built-in self-test (MBIST) test time reduction

Zero test time memory using background built-in self-test

Built-in-self-test (BIST) engine configured to store a per pattern...

Programmable counter to control memory built in self-test

Apparatus for capturing results of memory testing

Staggered start of BIST controllers and BIST engines

Decreasing power supply demand during BIST initializations

Interleaving of memory repair data compression and fuse programming...

Validating interconnections between logic blocks in a circuit descr...

Selectable repair pass masking

Determining fusebay storage element usage

Fusebay controller structure, system, and method

Structure and method for storing multiple repair pass data into a f...

Circuit structure and method for digital integrated circuit perform...

Structure for increasing fuse programming yield

Device threshold calibration through state dependent burn-in

Automatically extensible addressing for shared array built-in self-...

Method and apparatus for increasing fuse programming yield through...

Patents Applicationslast 30 patents

CIRCUIT AND METHOD FOR SOFT-ERROR PROTECTION IN OPERATION OF ECC AN...

MEMORY BUILT-IN SELF TEST ERROR CORRECTING CODE (MBIST ECC) FOR LOW...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST

ZERO TEST TIME MEMORY USING BACKGROUND BUILT-IN SELF-TEST

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

BUILT-IN SELF-TEST (BIST) ENGINE CONFIGURED TO STORE A PER PATTERN...

MEMORY BUILT-IN SELF-TEST (MBIST) TEST TIME REDUCTION

BUILT-IN SELF-TEST (BIST) ENGINE

APPARATUS FOR CAPTURING RESULTS OF MEMORY TESTING

DECREASING POWER SUPPLY DEMAND DURING BIST INITIALIZATIONS

STAGGERED START OF BIST CONTROLLERS AND BIST ENGINES

VALIDATING INTERCONNECTIONS BETWEEN LOGIC BLOCKS IN A CIRCUIT DESCR...

DETERMINING FUSEBAY STORAGE ELEMENT USAGE

FUSEBAY CONTROLLER STRUCTURE, SYSTEM, AND METHOD

STRUCTURE AND METHOD FOR STORING MULTIPLE REPAIR PASS DATA INTO A F...

INTERLEAVING OF MEMORY REPAIR DATA COMPRESSION AND FUSE PROGRAMMING...

SELECTABLE REPAIR PASS MASKING

METHOD, APPARATUS, AND DESIGN STRUCTURE FOR BUILT-IN SELF-TEST

CIRCUIT STRUCTURE AND METHOD FOR DIGITAL INTEGRATED CIRCUIT PERFORM...

AUTOMATICALLY EXTENSIBLE ADDRESSING FOR SHARED ARRAY BUILT-IN SELF-...

Device Threshold Calibration Through State Dependent Burnin

DESIGN STRUCTURE FOR INCREASING FUSE PROGRAMMING YIELD

DEVICE THRESHOLD CALIBRATION THROUGH STATE DEPENDENT BURNIN

METHOD AND APPARATUS FOR INCREASING FUSE PROGRAMMING YIELD THROUGH...