Michael Abraham

Person

Mainz, 55129, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Device for measuring surface defects
- Patent number 6,954,267
- Issue date Oct 11, 2005
- NanoPhotonics AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Measuring module
- Patent number 6,798,513
- Issue date Sep 28, 2004
- NanoPhotonics AB
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum measurement device
- Patent number 6,734,969
- Issue date May 11, 2004
- NanoPhotonics AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Micropolarimeter and ellipsometer
- Patent number 6,275,291
- Issue date Aug 14, 2001
- NanoPhotonics AG
- Michael Abraham
- G02 - OPTICS
Information Patent Grant
Micropolarimeter
- Patent number 6,268,915
- Issue date Jul 31, 2001
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for automatic relative adjustment of samples in r...
- Patent number 6,091,499
- Issue date Jul 18, 2000
- NanoPhotonics AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Grant
Micropolarimeter, microsensor system and method of characterizing t...
- Patent number 5,502,567
- Issue date Mar 26, 1996
- International Business Machines Corporation
- Peter Pokrowsky
- G01 - MEASURING TESTING
Information Patent Grant
Sensor head for use in atomic force microscopy and method for its p...
- Patent number 5,465,611
- Issue date Nov 14, 1995
- IMM Institut Fur Mikrotechnik GmbH
- Alexander Ruf
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Measurement module
- Publication number 20030196343
- Publication date Oct 23, 2003
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring module
- Publication number 20030193660
- Publication date Oct 16, 2003
- NANOPHOTONICS AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Application
Device for measuring surface defects
- Publication number 20030193666
- Publication date Oct 16, 2003
- NANOPHOTONICS AG
- Michael Abraham
- G01 - MEASURING TESTING
Information Patent Application
Vacuum measurement device
- Publication number 20020101591
- Publication date Aug 1, 2002
- Michael Abraham
- G01 - MEASURING TESTING

Michael Abraham

Person

Patents Grantslast 30 patents

Device for measuring surface defects

Measuring module

Vacuum measurement device

Micropolarimeter and ellipsometer

Micropolarimeter

Method and device for automatic relative adjustment of samples in r...

Micropolarimeter, microsensor system and method of characterizing t...

Sensor head for use in atomic force microscopy and method for its p...

Patents Applicationslast 30 patents

Measurement module

Measuring module

Device for measuring surface defects

Vacuum measurement device