Michael Abraham

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Mainz, DE

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Patents Grantslast 30 patents

Information Patent Grant
Modular substrate measurement system
- Patent number 7,030,401
- Issue date Apr 18, 2006
- NanoPhotonics AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement configuration including a vehicle and method for perfor...
- Patent number 6,935,201
- Issue date Aug 30, 2005
- Infineon Technologies AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement box with module for measuring wafer characteristics
- Patent number 6,891,609
- Issue date May 10, 2005
- NanoPhotonics AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modular substrate measurement system
- Patent number 6,420,864
- Issue date Jul 16, 2002
- NanoPhotonics AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Measurement configuration including a vehicle and method for perfor...
- Publication number 20040050189
- Publication date Mar 18, 2004
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement box
- Publication number 20030193671
- Publication date Oct 16, 2003
- NANOPHOTONICS AG
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modular substrate measurement system
- Publication number 20030101577
- Publication date Jun 5, 2003
- Michael Abraham
- H01 - BASIC ELECTRIC ELEMENTS